T. Eickhoff
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
-
- Semiconductor materials and devices
- Thin-Film Transistor Technologies
- Silicon Carbide Semiconductor Technologies
- Silicon and Solar Cell Technologies
Papers in
-
- Thin-Film Transistor Technologies 14
- Silicon and Solar Cell Technologies 11
- Semiconductor materials and devices 9
- Silicon Carbide Semiconductor Technologies 6
- Chalcogenide Semiconductor Thin Films 3
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- Silicon Nanostructures and Photoluminescence 9
- Co-authors
- W. Drube (11 shared papers)L. I. Johansson (6 shared papers)W. Theiß (3 shared papers)Peter Große (3 shared papers)C. Virojanadara (4 shared papers)V. R. R. Medicherla (1 shared paper)H. Wagner (10 shared papers)Per‐Anders Glans (3 shared papers)
- Journals
- Applied Surface Science (4 papers)Surface Science (3 papers)Journal of Non-Crystalline Solids (2 papers)Surface and Interface Analysis (1 paper)Physical Review Letters (1 paper)
- Partner nations
- GermanySwedenUnited Kingdom
In The Last Decade
T. Eickhoff
31 papers receiving 380 citations
Peers
Comparison fields: 5 of 37
- Surfaces, Coatings and Films 66
- Electrical and Electronic Engineering 285
- Structural Biology 7
- Materials Chemistry 213
- Radiation 39
Countries citing papers authored by T. Eickhoff
This map shows the geographic impact of T. Eickhoff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by T. Eickhoff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites T. Eickhoff more than expected).
Fields of papers citing papers by T. Eickhoff
This network shows the impact of papers produced by T. Eickhoff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by T. Eickhoff. The network helps show where T. Eickhoff may publish in the future.
Co-authors
The 25 scholars most cited alongside T. Eickhoff, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2002 | 45 | |
| 2 | 2004 | 41 | |
| 3 | 2002 | 38 | |
| 4 | 2003 | 38 | |
| 5 | 1990 | 36 | |
| 6 | 2001 | 23 | |
| 7 | 2005 | 18 | |
| 8 | 1996 | 17 | |
| 9 | 1990 | 15 | |
| 10 | 1992 | 14 | |
| 11 | 1992 | 13 | |
| 12 | 1999 | 13 | |
| 13 | 1992 | 12 | |
| 14 | 1997 | 11 | |
| 15 | 2002 | 11 | |
| 16 | 1990 | 9 | |
| 17 | 1997 | 7 | |
| 18 | 1990 | 6 | |
| 19 | 1993 | 5 | |
| 20 | 1996 | 5 |
About T. Eickhoff
T. Eickhoff is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Biomedical Engineering, having authored 31 papers that have together received 397 indexed citations. Recurring topics across this work include Thin-Film Transistor Technologies (14 papers), Silicon and Solar Cell Technologies (11 papers), Silicon Nanostructures and Photoluminescence (9 papers), Semiconductor materials and devices (9 papers), Silicon Carbide Semiconductor Technologies (6 papers), Semiconductor materials and interfaces (6 papers), Electron and X-Ray Spectroscopy Techniques (4 papers) and Chalcogenide Semiconductor Thin Films (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (66 citations), Electrical and Electronic Engineering (285 citations), Structural Biology (7 citations), Materials Chemistry (213 citations) and Radiation (39 citations). T. Eickhoff has collaborated with scholars based in Germany, Sweden and United Kingdom. Frequent co-authors include W. Drube, L. I. Johansson, W. Theiß, Peter Große, C. Virojanadara, V. R. R. Medicherla, H. Wagner, Per‐Anders Glans, W. Richter and Dietrich R. T. Zahn. Their work appears in journals such as Applied Surface Science, Surface Science, Journal of Non-Crystalline Solids, Surface and Interface Analysis and Physical Review Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.