Sik‐Chol Kwon

1.4k citations
47 papers · 1.2k · h-index 18

Impact in

Papers in

Sik‐Chol Kwon

44 papers receiving 1.1k citations

Peers

Sik‐Chol Kwon
Comparison fields: 5 of 49
  • Mechanics of Materials 572
  • Electrochemistry 119
  • Materials Chemistry 729
  • Mechanical Engineering 376
  • Metals and Alloys 25
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Agnieszka Bigos Poland
S.K. Ghosh India
Li’an Zhu China
Josef Brenner Austria
Kaigui Zhu China
A. Budniok Poland
K. Kobayashi Japan
J.M. Albella Spain
Siqian Bao China
J. Rezek Czechia
Sik‐Chol Kwon relative to Agnieszka Bigos Poland Agnieszka Bigos's profile →
Citations per field
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Citations per year

Countries citing papers authored by Sik‐Chol Kwon

Since Specialization
Citations

This map shows the geographic impact of Sik‐Chol Kwon's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Sik‐Chol Kwon with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Sik‐Chol Kwon more than expected).

Fields of papers citing papers by Sik‐Chol Kwon

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Sik‐Chol Kwon. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Sik‐Chol Kwon. The network helps show where Sik‐Chol Kwon may publish in the future.

Co-authors

The 25 scholars most cited alongside Sik‐Chol Kwon, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Sik‐Chol Kwon Line = papers co-authored together Sik‐Chol Kwon links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 47 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200497
2 201190
3 200282
4 201577
5 201568
6 201565
7 201558
8 200951
9 200350
10 201148
11 200443
12 201135
13 201434
14 200332
15 201125
16 200722
17 199918
18 200418
19 200617
20 200917

About Sik‐Chol Kwon

Sik‐Chol Kwon is a scholar working on Materials Chemistry, Electrical and Electronic Engineering, Mechanics of Materials, Mechanical Engineering and Aerospace Engineering, having authored 47 papers that have together received 1.2k indexed citations. Recurring topics across this work include Electrodeposition and Electroless Coatings (18 papers), Metal and Thin Film Mechanics (17 papers), Diamond and Carbon-based Materials Research (16 papers), Semiconductor materials and devices (8 papers), Corrosion Behavior and Inhibition (8 papers), Advanced materials and composites (8 papers), High-Temperature Coating Behaviors (7 papers) and Electrochemical Analysis and Applications (6 papers). The work is most often cited by research in Mechanics of Materials (572 citations), Electrochemistry (119 citations), Materials Chemistry (729 citations), Mechanical Engineering (376 citations) and Metals and Alloys (25 citations). Sik‐Chol Kwon has collaborated with scholars based in South Korea, China and Ukraine. Frequent co-authors include Shihong Zhang, Wanglin Chen, Ф. И. Данилов, V. S. Protsenko, Yue Lin, Dong-Soo Kim, Doyon Chang, Yiyong Wu, Kee‐Seok Nam and J.H. Ko. Their work appears in journals such as Surface and Coatings Technology, Thin Solid Films, Applied Surface Science, Laser Physics Letters and Transactions of Nonferrous Metals Society of China.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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