S.E. Kerns

1.2k citations
59 papers · 776 · h-index 16

Impact in

    • VLSI and Analog Circuit Testing
    • Radiation Effects in Electronics
    • Semiconductor materials and devices
    • Integrated Circuits and Semiconductor Failure Analysis
    • Advancements in Semiconductor Devices and Circuit Design
    • Low-power high-performance VLSI design
    • Thin-Film Transistor Technologies

Papers in

    • Semiconductor materials and devices 35
    • Radiation Effects in Electronics 24
    • Advancements in Semiconductor Devices and Circuit Design 16
    • Integrated Circuits and Semiconductor Failure Analysis 12
    • Low-power high-performance VLSI design 6
    • VLSI and Analog Circuit Testing 9

S.E. Kerns

55 papers receiving 743 citations

Peers

S.E. Kerns
Comparison fields: 5 of 54
  • Hardware and Architecture 183
  • Electrical and Electronic Engineering 688
  • Instrumentation 21
  • Structural Biology 5
  • Radiation 30
Replace T. F. Miyahira with:
T. F. Miyahira United States
Vyshnavi Suntharalingam United States
Timothy J. Maloney United States
James R. Schwank United States
S. Kuboyama Japan
F. Bedeschi Italy
Leif Scheick United States
F. Darracq France
A. Hoffmann France
José Lipovetzky Argentina
S.E. Kerns relative to T. F. Miyahira United States T. F. Miyahira's profile →
Citations per field
00.5×1.5×
T. F. Miyahira · 1×
Citations per year

Countries citing papers authored by S.E. Kerns

Since Specialization
Citations

This map shows the geographic impact of S.E. Kerns's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S.E. Kerns with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S.E. Kerns more than expected).

Fields of papers citing papers by S.E. Kerns

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S.E. Kerns. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S.E. Kerns. The network helps show where S.E. Kerns may publish in the future.

Co-authors

The 25 scholars most cited alongside S.E. Kerns, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S.E. Kerns Line = papers co-authored together S.E. Kerns links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 59 papers — load more, or switch the sort, to bring in the rest.

#Work
1 199997
2 199073
3 198870
4 198863
5 198954
6 199346
7 199142
8 199834
9 200125
10 199422
11 200421
12 200520
13 200219
14 199119
15 200517
16 198915
17 199911
18 200210
19 20009
20 20019

About S.E. Kerns

S.E. Kerns is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Atomic and Molecular Physics, and Optics, Media Technology and Biomedical Engineering, having authored 59 papers that have together received 776 indexed citations. Recurring topics across this work include Semiconductor materials and devices (35 papers), Radiation Effects in Electronics (24 papers), Advancements in Semiconductor Devices and Circuit Design (16 papers), Integrated Circuits and Semiconductor Failure Analysis (12 papers), VLSI and Analog Circuit Testing (9 papers), Engineering Education and Curriculum Development (6 papers), Low-power high-performance VLSI design (6 papers) and Experimental Learning in Engineering (4 papers). The work is most often cited by research in Hardware and Architecture (183 citations), Electrical and Electronic Engineering (688 citations), Instrumentation (21 citations), Structural Biology (5 citations) and Radiation (30 citations). S.E. Kerns has collaborated with scholars based in United States, France and Morocco. Frequent co-authors include L. W. Massengill, D.V. Kerns, Michael L. Alles, A. Hoffmann, B. L. Bhuva, N. Akil, Jean‐Pierre Charles, W.J. Stapor, P.T. McDonald and A.B. Campbell. Their work appears in journals such as IEEE Transactions on Nuclear Science, Applied Physics Letters, IEEE Transactions on Electron Devices, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems and IEEE Electron Device Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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