Sang‐Won Kang

103 papers receiving 2.0k citations

Peers

Sang‐Won Kang
Comparison fields: 5 of 76
  • Electronic, Optical and Magnetic Materials 615
  • Electrical and Electronic Engineering 1.5k
  • Materials Chemistry 984
  • Condensed Matter Physics 187
  • Radiation 108
Replace Young K. Yoo with:
Young K. Yoo United States
Hongwei Liang China
Hideto Imai Japan
Da‐Hua Wei Taiwan
Sung‐Il Baik United States
Yoshiki Seno Japan
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Qiangqiang Zhu China
Xin Pan China
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Citations per year

Countries citing papers authored by Sang‐Won Kang

Since Specialization
Citations

This map shows the geographic impact of Sang‐Won Kang's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Sang‐Won Kang with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Sang‐Won Kang more than expected).

Fields of papers citing papers by Sang‐Won Kang

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Sang‐Won Kang. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Sang‐Won Kang. The network helps show where Sang‐Won Kang may publish in the future.

Co-authors

The 25 scholars most cited alongside Sang‐Won Kang, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Sang‐Won Kang Line = papers co-authored together Sang‐Won Kang links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 109 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2009183
2 2004151
3 2008135
4 200499
5 200282
6 200480
7 201063
8 200163
9 200358
10 199857
11 200156
12 199448
13 200744
14 200043
15 200243
16 199938
17 200236
18 200236
19 200035
20 200734

About Sang‐Won Kang

Sang‐Won Kang is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Materials Chemistry, Mechanics of Materials and Radiation, having authored 109 papers that have together received 2.1k indexed citations. Recurring topics across this work include Semiconductor materials and devices (47 papers), Copper Interconnects and Reliability (30 papers), Metal and Thin Film Mechanics (23 papers), Advanced Radiotherapy Techniques (22 papers), GaN-based semiconductor devices and materials (12 papers), Advanced X-ray and CT Imaging (9 papers), Radiation Therapy and Dosimetry (9 papers) and Electronic and Structural Properties of Oxides (9 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (615 citations), Electrical and Electronic Engineering (1.5k citations), Materials Chemistry (984 citations), Condensed Matter Physics (187 citations) and Radiation (108 citations). Sang‐Won Kang has collaborated with scholars based in South Korea, United States and Romania. Frequent co-authors include Oh-Kyum Kwon, Se‐Hun Kwon, Yong Ju Lee, Hyung‐Sang Park, Sang Ouk Kim, Jae‐Hoon Kim, Sung‐Wook Kim, Jin‐Seong Park, Seong‐Jun Jeong and Hyeokjo Gwon. Their work appears in journals such as Journal of The Electrochemical Society, Electrochemical and Solid-State Letters, Applied Physics Letters, Japanese Journal of Applied Physics and Journal of Vacuum Science & Technology A Vacuum Surfaces and Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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