S. Thakur

48 papers receiving 865 citations

Peers

S. Thakur
Comparison fields: 5 of 63
  • Surfaces, Coatings and Films 115
  • Electrical and Electronic Engineering 504
  • Materials Chemistry 387
  • Atomic and Molecular Physics, and Optics 236
  • Computational Mechanics 150
Replace R.B. Tokas with:
R.B. Tokas India
S. Jena India
Amal Chabli France
Xiaodong Yuan China
A. Rahim Forouhi United States
D. Hirsch Germany
J. Sapjeta United States
F. Paumier France
A. Poruba Czechia
W.M. Arnoldbik Netherlands
S. Thakur relative to R.B. Tokas India R.B. Tokas's profile →
Citations per field
00.5×1.5×
R.B. Tokas · 1×
Citations per year

Countries citing papers authored by S. Thakur

Since Specialization
Citations

This map shows the geographic impact of S. Thakur's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by S. Thakur with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites S. Thakur more than expected).

Fields of papers citing papers by S. Thakur

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by S. Thakur. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by S. Thakur. The network helps show where S. Thakur may publish in the future.

Co-authors

The 25 scholars most cited alongside S. Thakur, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with S. Thakur Line = papers co-authored together S. Thakur links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 50 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200595
2 200088
3 201680
4 201555
5 201849
6 200348
7 201941
8 200234
9 200632
10 202228
11 201927
12 201625
13 201023
14 200422
15 201122
16 201321
17 201720
18 202018
19 200718
20 200116

About S. Thakur

S. Thakur is a scholar working on Electrical and Electronic Engineering, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Computational Mechanics, having authored 50 papers that have together received 884 indexed citations. Recurring topics across this work include Semiconductor materials and devices (16 papers), Optical Coatings and Gratings (15 papers), Surface Roughness and Optical Measurements (8 papers), Metal and Thin Film Mechanics (7 papers), Force Microscopy Techniques and Applications (7 papers), Photonic Crystals and Applications (7 papers), Laser Material Processing Techniques (6 papers) and Advanced Surface Polishing Techniques (6 papers). The work is most often cited by research in Surfaces, Coatings and Films (115 citations), Electrical and Electronic Engineering (504 citations), Materials Chemistry (387 citations), Atomic and Molecular Physics, and Optics (236 citations) and Computational Mechanics (150 citations). S. Thakur has collaborated with scholars based in India and Taiwan. Frequent co-authors include N. K. Sahoo, R.B. Tokas, S. Jena, D. Bhattacharyya, D. V. Udupa, N. C. Das, K. Divakar Rao, M. Senthilkumar, S. Maidul Haque and D. Bhattacharyya. Their work appears in journals such as Thin Solid Films, Applied Surface Science, Journal of Physics D Applied Physics, Journal of Applied Physics and Vacuum.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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