Ryan Lowe
Impact in
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- Reliability and Maintenance Optimization
Papers in
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- Electronic Packaging and Soldering Technologies 21
- Integrated Circuits and Semiconductor Failure Analysis 15
- Electrostatic Discharge in Electronics 4
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- Structural Health Monitoring Techniques 8
- Co-authors
- Pradeep Lall (33 shared papers)Kai Goebel (18 shared papers)Jeff Suhling (7 shared papers)Jason R. Foley (3 shared papers)Cynthia H. McCollough (1 shared paper)Eric C. Ehman (1 shared paper)Brian W. Pickering (1 shared paper)Avinash Nehra (1 shared paper)
- Journals
- Journal of Electronic Packaging (2 papers)Abdominal Radiology (1 paper)IEEE Transactions on Industrial Electronics (1 paper)IEEE Transactions on Reliability (1 paper)
- Partner nations
- United StatesGermany
In The Last Decade
Ryan Lowe
35 papers receiving 340 citations
Peers
Comparison fields: 5 of 49
- Safety, Risk, Reliability and Quality 50
- Statistics, Probability and Uncertainty 34
- Control and Systems Engineering 90
- Civil and Structural Engineering 82
- Electrical and Electronic Engineering 202
Countries citing papers authored by Ryan Lowe
This map shows the geographic impact of Ryan Lowe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Ryan Lowe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Ryan Lowe more than expected).
Fields of papers citing papers by Ryan Lowe
This network shows the impact of papers produced by Ryan Lowe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Ryan Lowe. The network helps show where Ryan Lowe may publish in the future.
Co-authors
The 22 scholars most cited alongside Ryan Lowe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 35 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2012 | 51 | |
| 2 | 2010 | 39 | |
| 3 | 2012 | 37 | |
| 4 | 2009 | 36 | |
| 5 | 2016 | 24 | |
| 6 | 2009 | 17 | |
| 7 | 2012 | 15 | |
| 8 | 2010 | 14 | |
| 9 | 2011 | 12 | |
| 10 | 2011 | 11 | |
| 11 | 2018 | 10 | |
| 12 | 2011 | 9 | |
| 13 | 2012 | 9 | |
| 14 | 2014 | 7 | |
| 15 | 2012 | 7 | |
| 16 | 2019 | 6 | |
| 17 | 2017 | 6 | |
| 18 | 2019 | 5 | |
| 19 | 2019 | 4 | |
| 20 | 2012 | 4 |
About Ryan Lowe
Ryan Lowe is a scholar working on Electrical and Electronic Engineering, Civil and Structural Engineering, Mechanics of Materials, Biomedical Engineering and Industrial and Manufacturing Engineering, having authored 35 papers that have together received 355 indexed citations. Recurring topics across this work include Electronic Packaging and Soldering Technologies (21 papers), Integrated Circuits and Semiconductor Failure Analysis (15 papers), Structural Health Monitoring Techniques (8 papers), Industrial Vision Systems and Defect Detection (5 papers), Electrostatic Discharge in Electronics (4 papers), Advanced X-ray and CT Imaging (4 papers), Mechanical Behavior of Composites (4 papers) and Medical Imaging Techniques and Applications (3 papers). The work is most often cited by research in Safety, Risk, Reliability and Quality (50 citations), Statistics, Probability and Uncertainty (34 citations), Control and Systems Engineering (90 citations), Civil and Structural Engineering (82 citations) and Electrical and Electronic Engineering (202 citations). Ryan Lowe has collaborated with scholars based in United States and Germany. Frequent co-authors include Pradeep Lall, Kai Goebel, Jeff Suhling, Jason R. Foley, Cynthia H. McCollough, Eric C. Ehman, Brian W. Pickering, Avinash Nehra, Sudhakar K. Venkatesh and Ahmed F. Halaweish. Their work appears in journals such as Journal of Electronic Packaging, Abdominal Radiology, IEEE Transactions on Industrial Electronics and IEEE Transactions on Reliability.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.