R.W. Vook
About
R.W. Vook has authored 130 papers that have received a total of 1.7k indexed citations.
This includes 59 papers in Atomic and Molecular Physics, and Optics, 58 papers in Electronic, Optical and Magnetic Materials and 44 papers in Materials Chemistry. The topics of these papers are Copper Interconnects and Reliability (57 papers), Surface and Thin Film Phenomena (36 papers) and nanoparticles nucleation surface interactions (30 papers). R.W. Vook is often cited by papers focused on Copper Interconnects and Reliability (57 papers), Surface and Thin Film Phenomena (36 papers) and nanoparticles nucleation surface interactions (30 papers) and collaborates with scholars based in United States, Japan and India. R.W. Vook's co-authors include Chih‐Yung Chang, S. S. Chao, V. D. Vankar, Yoshikatsu Namba and F. Witt and has published in prestigious journals such as Applied Physics Letters, Journal of Applied Physics and Journal of The Electrochemical Society.
In The Last Decade
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