R.W. Vook
Impact in
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- Copper Interconnects and Reliability
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
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- Surface and Thin Film Phenomena 36
- Advanced Chemical Physics Studies 13
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- Copper Interconnects and Reliability 57
- Co-authors
- F. Witt (4 shared papers)Chih‐Yung Chang (12 shared papers)Yoshikatsu Namba (4 shared papers)S. S. Chao (6 shared papers)Jackson Ho (4 shared papers)Byung-Ho Jo (4 shared papers)Frank-Thomas Koch (4 shared papers)C. A. Wert (1 shared paper)
- Journals
- Thin Solid Films (23 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (14 papers)Journal of Applied Physics (13 papers)Applied Surface Science (11 papers)Surface Science (8 papers)
- Partner nations
- United StatesChinaJapan
In The Last Decade
R.W. Vook
131 papers receiving 1.7k citations
Peers
Comparison fields: 5 of 57
- Electronic, Optical and Magnetic Materials 658
- Surfaces, Coatings and Films 201
- Atomic and Molecular Physics, and Optics 651
- Mechanics of Materials 471
- Atmospheric Science 307
Countries citing papers authored by R.W. Vook
This map shows the geographic impact of R.W. Vook's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by R.W. Vook with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites R.W. Vook more than expected).
Fields of papers citing papers by R.W. Vook
This network shows the impact of papers produced by R.W. Vook. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by R.W. Vook. The network helps show where R.W. Vook may publish in the future.
Co-authors
The 25 scholars most cited alongside R.W. Vook, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 133 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1965 | 140 | |
| 2 | 1968 | 103 | |
| 3 | 1982 | 89 | |
| 4 | 1991 | 87 | |
| 5 | 1993 | 62 | |
| 6 | 1993 | 52 | |
| 7 | 1989 | 44 | |
| 8 | 1965 | 44 | |
| 9 | 1958 | 43 | |
| 10 | 1983 | 42 | |
| 11 | 1978 | 38 | |
| 12 | 1995 | 35 | |
| 13 | 1974 | 30 | |
| 14 | 1991 | 30 | |
| 15 | 1981 | 29 | |
| 16 | 1968 | 28 | |
| 17 | 1961 | 27 | |
| 18 | 1965 | 27 | |
| 19 | 1969 | 25 | |
| 20 | 1975 | 24 |
About R.W. Vook
R.W. Vook is a scholar working on Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Materials Chemistry, Electrical and Electronic Engineering and Mechanics of Materials, having authored 133 papers that have together received 1.9k indexed citations. Recurring topics across this work include Copper Interconnects and Reliability (57 papers), Surface and Thin Film Phenomena (36 papers), nanoparticles nucleation surface interactions (31 papers), Metal and Thin Film Mechanics (24 papers), Semiconductor materials and devices (18 papers), Electronic Packaging and Soldering Technologies (16 papers), Advanced Chemical Physics Studies (13 papers) and Electrical Contact Performance and Analysis (13 papers). The work is most often cited by research in Electronic, Optical and Magnetic Materials (658 citations), Surfaces, Coatings and Films (201 citations), Atomic and Molecular Physics, and Optics (651 citations), Mechanics of Materials (471 citations) and Atmospheric Science (307 citations). R.W. Vook has collaborated with scholars based in United States, China and Japan. Frequent co-authors include F. Witt, Chih‐Yung Chang, Yoshikatsu Namba, S. S. Chao, Jackson Ho, Byung-Ho Jo, Frank-Thomas Koch, C. A. Wert, Masanori Murakami and Bruno C. De Cooman. Their work appears in journals such as Thin Solid Films, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal of Applied Physics, Applied Surface Science and Surface Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.