Peter Seyfried
Impact in
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- Scientific Measurement and Uncertainty Evaluation
- Radiation top 5%
- Radioactive Decay and Measurement Techniques
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
- Nuclear Physics and Applications
Papers in
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- Advanced Electrical Measurement Techniques 4
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- Advanced Measurement and Metrology Techniques 4
- Co-authors
- Peter Becker (6 shared papers)H. Siegert (3 shared papers)K. Dorenwendt (1 shared paper)R. Probst (1 shared paper)Rolf Lauer (1 shared paper)Manfred Weck (1 shared paper)P.A. McKeown (1 shared paper)H. Kunzmann (1 shared paper)
In The Last Decade
Peter Seyfried
16 papers receiving 304 citations
Peers
Comparison fields: 5 of 45
- Statistics, Probability and Uncertainty 107
- Radiation 122
- Atomic and Molecular Physics, and Optics 115
- Surfaces, Coatings and Films 26
- Mechanical Engineering 105
Countries citing papers authored by Peter Seyfried
This map shows the geographic impact of Peter Seyfried's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Seyfried with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Seyfried more than expected).
Fields of papers citing papers by Peter Seyfried
This network shows the impact of papers produced by Peter Seyfried. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Seyfried. The network helps show where Peter Seyfried may publish in the future.
Co-authors
The 12 scholars most cited alongside Peter Seyfried, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1981 | 164 | |
| 2 | 1991 | 29 | |
| 3 | 1984 | 23 | |
| 4 | 1987 | 18 | |
| 5 | 1987 | 17 | |
| 6 | 2015 | 16 | |
| 7 | 1988 | 15 | |
| 8 | 1971 | 12 | |
| 9 | 1994 | 11 | |
| 10 | 1975 | 9 | |
| 11 | 1963 | 8 | |
| 12 | 1989 | 7 | |
| 13 | 1984 | 4 | |
| 14 | Work Related to the Determination of the Avogadro Constant in the PTB | 1981 | 3 |
| 15 | 1975 | 3 | |
| 16 | Progress in precision engineering : proceedings of the 6th International Precision Engineering Seminar (IPES 6) [and] 2nd International Conference on Ultraprecision in Manufacturing Engineering (UME 2), May 1991, Braunschweig, Germany | 1991 | 1 |
| 17 | 1966 | 1 |
About Peter Seyfried
Peter Seyfried is a scholar working on Electrical and Electronic Engineering, Mechanical Engineering, Computer Networks and Communications, Atomic and Molecular Physics, and Optics and Statistics, Probability and Uncertainty, having authored 17 papers that have together received 341 indexed citations. Recurring topics across this work include Advanced Electrical Measurement Techniques (4 papers), Advanced Measurement and Metrology Techniques (4 papers), Sensor Technology and Measurement Systems (4 papers), Magnetic Properties and Applications (3 papers), Scientific Measurement and Uncertainty Evaluation (3 papers), Force Microscopy Techniques and Applications (2 papers), Advanced Surface Polishing Techniques (2 papers) and Optical measurement and interference techniques (1 paper). The work is most often cited by research in Statistics, Probability and Uncertainty (107 citations), Radiation (122 citations), Atomic and Molecular Physics, and Optics (115 citations), Surfaces, Coatings and Films (26 citations) and Mechanical Engineering (105 citations). Peter Seyfried has collaborated with scholars based in Germany, Italy and China. Frequent co-authors include Peter Becker, H. Siegert, K. Dorenwendt, R. Probst, Rolf Lauer, Manfred Weck, P.A. McKeown, H. Kunzmann, Dominic Windisch and Feipeng Li. Their work appears in journals such as IEEE Transactions on Instrumentation and Measurement, Metrologia, Review of Scientific Instruments, Physical Review Letters and The European Physical Journal B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.