Peter Sandborn
Impact in
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- Transportation Systems and Infrastructure
- Product Development and Customization
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- Reliability and Maintenance Optimization
- Technology Assessment and Management
Papers in
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- Reliability and Maintenance Optimization 43
- Technology Assessment and Management 41
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- Transportation Systems and Infrastructure 42
- Product Development and Customization 15
- Co-authors
- Michael Pecht (13 shared papers)Andre Kleyner (4 shared papers)Navid Goudarzi (7 shared papers)Chris Wilkinson (2 shared papers)C.F. Murphy (12 shared papers)P.A. Blakey (4 shared papers)Diego Galar (8 shared papers)Magdy S. Abadir (8 shared papers)
- Journals
- Microelectronics Reliability (7 papers)IEEE Transactions on Components and Packaging Technologies (6 papers)IEEE Transactions on Electronics Packaging Manufacturing (5 papers)IEEE Transactions on Advanced Packaging (4 papers)IEEE Transactions on Electron Devices (3 papers)
- Partner nations
- United StatesSwedenCanada
In The Last Decade
Peter Sandborn
173 papers receiving 2.5k citations
Peers
Comparison fields: 5 of 118
- Management of Technology and Innovation 866
- Safety, Risk, Reliability and Quality 1.0k
- Medical Laboratory Technology 111
- Statistics, Probability and Uncertainty 273
- Software 112
Countries citing papers authored by Peter Sandborn
This map shows the geographic impact of Peter Sandborn's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Sandborn with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Sandborn more than expected).
Fields of papers citing papers by Peter Sandborn
This network shows the impact of papers produced by Peter Sandborn. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Sandborn. The network helps show where Peter Sandborn may publish in the future.
Co-authors
The 25 scholars most cited alongside Peter Sandborn, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 188 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2018 | 163 | |
| 2 | 2000 | 143 | |
| 3 | 2009 | 103 | |
| 4 | 2006 | 92 | |
| 5 | 2007 | 86 | |
| 6 | 2007 | 80 | |
| 7 | 2007 | 71 | |
| 8 | 2012 | 67 | |
| 9 | 2007 | 62 | |
| 10 | 2007 | 61 | |
| 11 | 1989 | 58 | |
| 12 | 2004 | 53 | |
| 13 | 2010 | 51 | |
| 14 | 2004 | 48 | |
| 15 | 2017 | 48 | |
| 16 | 2012 | 41 | |
| 17 | 1987 | 40 | |
| 18 | 1994 | 40 | |
| 19 | 2017 | 40 | |
| 20 | 2013 | 39 |
About Peter Sandborn
Peter Sandborn is a scholar working on Safety, Risk, Reliability and Quality, Management of Technology and Innovation, Electrical and Electronic Engineering, Industrial and Manufacturing Engineering and Accounting, having authored 188 papers that have together received 2.7k indexed citations. Recurring topics across this work include Reliability and Maintenance Optimization (43 papers), Transportation Systems and Infrastructure (42 papers), Technology Assessment and Management (41 papers), Manufacturing Process and Optimization (19 papers), Life Cycle Costing Analysis (17 papers), Historical Studies in Central America (16 papers), VLSI and FPGA Design Techniques (16 papers) and Product Development and Customization (15 papers). The work is most often cited by research in Management of Technology and Innovation (866 citations), Safety, Risk, Reliability and Quality (1.0k citations), Medical Laboratory Technology (111 citations), Statistics, Probability and Uncertainty (273 citations) and Software (112 citations). Peter Sandborn has collaborated with scholars based in United States, Sweden and Canada. Frequent co-authors include Michael Pecht, Andre Kleyner, Navid Goudarzi, Chris Wilkinson, C.F. Murphy, P.A. Blakey, Diego Galar, Magdy S. Abadir, Paramvir Singh and Uday Kumar. Their work appears in journals such as Microelectronics Reliability, IEEE Transactions on Components and Packaging Technologies, IEEE Transactions on Electronics Packaging Manufacturing, IEEE Transactions on Advanced Packaging and IEEE Transactions on Electron Devices.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.