Peter Kuschnerus
Impact in
- Structural Biology top 5%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
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- Advancements in Photolithography Techniques 8
- Silicon Carbide Semiconductor Technologies 2
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- Calibration and Measurement Techniques 5
- Co-authors
- Hans Rabus (5 shared papers)M. Richter (5 shared papers)G. Ulm (5 shared papers)Frank Scholze (3 shared papers)K. Goetz (2 shared papers)Andreas Bauer (2 shared papers)J. Kräußlich (2 shared papers)P. Käckell (2 shared papers)
In The Last Decade
Peter Kuschnerus
15 papers receiving 370 citations
Peers
Comparison fields: 5 of 43
- Structural Biology 49
- Surfaces, Coatings and Films 76
- Radiation 51
- Statistics, Probability and Uncertainty 27
- Electrical and Electronic Engineering 213
Countries citing papers authored by Peter Kuschnerus
This map shows the geographic impact of Peter Kuschnerus's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Kuschnerus with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Kuschnerus more than expected).
Fields of papers citing papers by Peter Kuschnerus
This network shows the impact of papers produced by Peter Kuschnerus. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Kuschnerus. The network helps show where Peter Kuschnerus may publish in the future.
Co-authors
The 23 scholars most cited alongside Peter Kuschnerus, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 102 | |
| 2 | 2004 | 74 | |
| 3 | 2000 | 66 | |
| 4 | 1996 | 63 | |
| 5 | 1998 | 38 | |
| 6 | 2000 | 16 | |
| 7 | 1995 | 16 | |
| 8 | 1998 | 6 | |
| 9 | 2005 | 6 | |
| 10 | 1999 | 4 | |
| 11 | 2003 | 2 | |
| 12 | Aerial image measurement system for 157nm lithography masks | 2003 | 2 |
| 13 | 2003 | 2 | |
| 14 | 2003 | 1 | |
| 15 | 2004 | 1 | |
| 16 | 2002 | 1 | |
| 17 | 2003 | 0 |
About Peter Kuschnerus
Peter Kuschnerus is a scholar working on Electrical and Electronic Engineering, Aerospace Engineering, Mechanical Engineering, Surfaces, Coatings and Films and Industrial and Manufacturing Engineering, having authored 17 papers that have together received 400 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (8 papers), Calibration and Measurement Techniques (5 papers), Industrial Vision Systems and Defect Detection (4 papers), Electron and X-Ray Spectroscopy Techniques (4 papers), Advanced Measurement and Metrology Techniques (3 papers), Optical measurement and interference techniques (2 papers), Silicon Carbide Semiconductor Technologies (2 papers) and Atmospheric Ozone and Climate (2 papers). The work is most often cited by research in Structural Biology (49 citations), Surfaces, Coatings and Films (76 citations), Radiation (51 citations), Statistics, Probability and Uncertainty (27 citations) and Electrical and Electronic Engineering (213 citations). Peter Kuschnerus has collaborated with scholars based in Germany and France. Frequent co-authors include Hans Rabus, M. Richter, G. Ulm, Frank Scholze, K. Goetz, Andreas Bauer, J. Kräußlich, P. Käckell, F. Bechstedt and J. Furthmüller. Their work appears in journals such as Metrologia, Materials Science and Engineering B, Physical review. B, Condensed matter, Applied Physics Letters and Journal of Synchrotron Radiation.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.