Peter Gselman

17 papers receiving 552 citations

Peter Gselman's Hit Papers

Review of Growth Defects in Thin Films Prepared by PVD Techniques 2020 · 267 citations
2670+2+4Years since publication50100150200250

Peers

Peter Gselman
Comparison fields: 5 of 66
  • Mechanics of Materials 277
  • Materials Chemistry 285
  • Physiology 21
  • Radiology, Nuclear Medicine and Imaging 84
  • Ceramics and Composites 18
Replace Yanling Xue with:
Yanling Xue China
Zhengduo Wang China
Rongyan Sun Japan
Moon Ki Kim South Korea
K.‐M. Baumgärtner Germany
Jiabin Gu China
Su B. Jin South Korea
Aicha Elshabini United States
Troy Munro United States
Peter Gselman relative to Yanling Xue China Yanling Xue's profile →
Citations per field
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Yanling Xue · 1×
Citations per year

Countries citing papers authored by Peter Gselman

Since Specialization
Citations

This map shows the geographic impact of Peter Gselman's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter Gselman with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter Gselman more than expected).

Fields of papers citing papers by Peter Gselman

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Peter Gselman. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter Gselman. The network helps show where Peter Gselman may publish in the future.

Co-authors

The 20 scholars most cited alongside Peter Gselman, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Peter Gselman Line = papers co-authored together Peter Gselman links everyone, so they are left out of the graph.

All Works

18 of 18 papers shown
#Work
1
Review of Growth Defects in Thin Films Prepared by PVD Techniques
Hit paper breakdown →
2020267
2 201372
3 201936
4 202132
5 202230
6 202127
7 201521
8 202218
9 202118
10 20238
11 20228
12 20216
13 20245
14 20225
15 20223
16 20251
17 20201
18 20250

About Peter Gselman

Peter Gselman is a scholar working on Radiology, Nuclear Medicine and Imaging, Electrical and Electronic Engineering, Mechanics of Materials, Surfaces, Coatings and Films and Materials Chemistry, having authored 18 papers that have together received 558 indexed citations. Recurring topics across this work include Plasma Applications and Diagnostics (11 papers), Metal and Thin Film Mechanics (6 papers), Electrohydrodynamics and Fluid Dynamics (6 papers), Surface Modification and Superhydrophobicity (5 papers), Diamond and Carbon-based Materials Research (4 papers), Ion-surface interactions and analysis (2 papers), Magnetic and Electromagnetic Effects (2 papers) and Mycotoxins in Agriculture and Food (2 papers). The work is most often cited by research in Mechanics of Materials (277 citations), Materials Chemistry (285 citations), Physiology (21 citations), Radiology, Nuclear Medicine and Imaging (84 citations) and Ceramics and Composites (18 citations). Peter Gselman has collaborated with scholars based in Slovenia, Austria and Czechia. Frequent co-authors include Matjaž Panjan, Miha Čekada, Aljaž Drnovšek, Miran Mozetič, Gregor Primc, Nina Recek, Tonica Bončina, Alenka Vesel, Rok Zaplotnik and P. Panjan. Their work appears in journals such as International Journal of Molecular Sciences, Plants, Materials, Plasma Processes and Polymers and Thin Solid Films.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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