Peter D. Nellist
Impact in
- Structural Biology top 0.01%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 0.05%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advanced Electron Microscopy Techniques and Applications 150
-
- Electron and X-Ray Spectroscopy Techniques 130
- Co-authors
- Stephen J. Pennycook (20 shared papers)Lewys Jones (50 shared papers)Timothy J. Pennycook (20 shared papers)J. M. Rodenburg (3 shared papers)Angus I. Kirkland (36 shared papers)Nigel D. Browning (11 shared papers)B. C. McCallum (2 shared papers)Hao Yang (15 shared papers)
- Journals
- Microscopy and Microanalysis (60 papers)Ultramicroscopy (28 papers)Applied Physics Letters (9 papers)Physical Review Letters (9 papers)Journal of Microscopy (7 papers)
- Partner nations
- United KingdomUnited StatesIreland
In The Last Decade
Peter D. Nellist
217 papers receiving 8.0k citations
Peers
Comparison fields: 5 of 132
- Structural Biology 3.6k
- Surfaces, Coatings and Films 3.0k
- Radiation 1.4k
- Materials Chemistry 3.3k
- Condensed Matter Physics 623
Countries citing papers authored by Peter D. Nellist
This map shows the geographic impact of Peter D. Nellist's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Peter D. Nellist with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Peter D. Nellist more than expected).
Fields of papers citing papers by Peter D. Nellist
This network shows the impact of papers produced by Peter D. Nellist. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Peter D. Nellist. The network helps show where Peter D. Nellist may publish in the future.
Co-authors
The 25 scholars most cited alongside Peter D. Nellist, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 230 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 396 | |
| 2 | 2015 | 314 | |
| 3 | 2000 | 294 | |
| 4 | 1996 | 285 | |
| 5 | 2004 | 276 | |
| 6 | 2011 | 273 | |
| 7 | 2020 | 260 | |
| 8 | 2010 | 244 | |
| 9 | 2016 | 215 | |
| 10 | 2014 | 212 | |
| 11 | 1995 | 191 | |
| 12 | 2008 | 159 | |
| 13 | 2003 | 144 | |
| 14 | 2014 | 142 | |
| 15 | 2013 | 138 | |
| 16 | 1998 | 136 | |
| 17 | 1998 | 123 | |
| 18 | 1993 | 121 | |
| 19 | 2013 | 117 | |
| 20 | 2020 | 110 |
About Peter D. Nellist
Peter D. Nellist is a scholar working on Structural Biology, Surfaces, Coatings and Films, Radiation, Materials Chemistry and Electrical and Electronic Engineering, having authored 230 papers that have together received 8.2k indexed citations. Recurring topics across this work include Advanced Electron Microscopy Techniques and Applications (150 papers), Electron and X-Ray Spectroscopy Techniques (130 papers), Advanced X-ray Imaging Techniques (57 papers), Force Microscopy Techniques and Applications (16 papers), Integrated Circuits and Semiconductor Failure Analysis (16 papers), Advanced Fluorescence Microscopy Techniques (15 papers), Semiconductor materials and devices (14 papers) and Surface and Thin Film Phenomena (12 papers). The work is most often cited by research in Structural Biology (3.6k citations), Surfaces, Coatings and Films (3.0k citations), Radiation (1.4k citations), Materials Chemistry (3.3k citations) and Condensed Matter Physics (623 citations). Peter D. Nellist has collaborated with scholars based in United Kingdom, United States and Ireland. Frequent co-authors include Stephen J. Pennycook, Lewys Jones, Timothy J. Pennycook, J. M. Rodenburg, Angus I. Kirkland, Nigel D. Browning, B. C. McCallum, Hao Yang, Sandra Van Aert and Gerardo Martínez. Their work appears in journals such as Microscopy and Microanalysis, Ultramicroscopy, Applied Physics Letters, Physical Review Letters and Journal of Microscopy.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.