Patrick W. Kalgren
Impact in
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- Fault Detection and Control Systems
- Machine Fault Diagnosis Techniques
- Engineering and Test Systems
Papers in
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- Engineering and Test Systems 16
- Fault Detection and Control Systems 12
- Machine Fault Diagnosis Techniques 8
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- Reliability and Maintenance Optimization 7
- Co-authors
- Michael J. Roemer (22 shared papers)Antonio E. Ginart (21 shared papers)Douglas W. Brown (9 shared papers)Carl S. Byington (11 shared papers)Matthew James Watson (1 shared paper)Moncef Abbas (2 shared papers)George Vachtsevanos (2 shared papers)I. Ali (2 shared papers)
- Journals
- IEEE Transactions on Instrumentation and Measurement (2 papers)IEEE Transactions on Power Electronics (2 papers)Microelectronics Reliability (1 paper)Electric Power Systems Research (1 paper)SAE technical papers on CD-ROM/SAE technical paper series (1 paper)
- Partner nations
- United StatesCanadaIran
In The Last Decade
Patrick W. Kalgren
39 papers receiving 673 citations
Peers
Comparison fields: 5 of 62
- Medical Laboratory Technology 41
- Control and Systems Engineering 354
- Safety, Risk, Reliability and Quality 130
- Statistics, Probability and Uncertainty 81
- Software 32
Countries citing papers authored by Patrick W. Kalgren
This map shows the geographic impact of Patrick W. Kalgren's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Patrick W. Kalgren with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Patrick W. Kalgren more than expected).
Fields of papers citing papers by Patrick W. Kalgren
This network shows the impact of papers produced by Patrick W. Kalgren. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Patrick W. Kalgren. The network helps show where Patrick W. Kalgren may publish in the future.
Co-authors
The 21 scholars most cited alongside Patrick W. Kalgren, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 42 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2006 | 118 | |
| 2 | 2011 | 105 | |
| 3 | 2009 | 59 | |
| 4 | 2007 | 43 | |
| 5 | 2008 | 43 | |
| 6 | 2007 | 32 | |
| 7 | 2006 | 28 | |
| 8 | 2004 | 26 | |
| 9 | 2004 | 25 | |
| 10 | 2006 | 22 | |
| 11 | 2009 | 22 | |
| 12 | 2007 | 21 | |
| 13 | 2017 | 21 | |
| 14 | 2010 | 18 | |
| 15 | 2007 | 14 | |
| 16 | 2008 | 13 | |
| 17 | 2006 | 10 | |
| 18 | 2010 | 10 | |
| 19 | 2008 | 9 | |
| 20 | 2005 | 9 |
About Patrick W. Kalgren
Patrick W. Kalgren is a scholar working on Control and Systems Engineering, Safety, Risk, Reliability and Quality, Electrical and Electronic Engineering, Medical Laboratory Technology and Hardware and Architecture, having authored 42 papers that have together received 713 indexed citations. Recurring topics across this work include Engineering and Test Systems (16 papers), Fault Detection and Control Systems (12 papers), Silicon Carbide Semiconductor Technologies (9 papers), Machine Fault Diagnosis Techniques (8 papers), Reliability and Maintenance Optimization (7 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), Semiconductor materials and devices (5 papers) and Electrostatic Discharge in Electronics (4 papers). The work is most often cited by research in Medical Laboratory Technology (41 citations), Control and Systems Engineering (354 citations), Safety, Risk, Reliability and Quality (130 citations), Statistics, Probability and Uncertainty (81 citations) and Software (32 citations). Patrick W. Kalgren has collaborated with scholars based in United States, Canada and Iran. Frequent co-authors include Michael J. Roemer, Antonio E. Ginart, Douglas W. Brown, Carl S. Byington, Matthew James Watson, Moncef Abbas, George Vachtsevanos, I. Ali, Kai Goebel and Raechel Johns. Their work appears in journals such as IEEE Transactions on Instrumentation and Measurement, IEEE Transactions on Power Electronics, Microelectronics Reliability, Electric Power Systems Research and SAE technical papers on CD-ROM/SAE technical paper series.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.