P. V. Varde

1.2k citations
62 papers · 1.0k · 1 hit paper · h-index 9

Impact in

Papers in

P. V. Varde

49 papers receiving 968 citations

P. V. Varde's Hit Papers

Light emitting diodes reliability review 2011 · 647 citations
6470+5+10Years since publication200400600

Peers

P. V. Varde
Comparison fields: 5 of 99
  • Condensed Matter Physics 310
  • Statistics, Probability and Uncertainty 88
  • Electrical and Electronic Engineering 492
  • Bioengineering 47
  • Safety, Risk, Reliability and Quality 58
Replace Moon‐Hwan Chang with:
Moon‐Hwan Chang United States
D. N. Bose India
Guannan Li China
Hyungchul Kim South Korea
Enze Zhang China
Muhammad Rafiq United Kingdom
J.J. Smit Netherlands
Ignacio Rey‐Stolle Spain
Chang‐Ju Lee South Korea
Jinwei Zhang China
P. V. Varde relative to Moon‐Hwan Chang United States Moon‐Hwan Chang's profile →
Citations per field
00.5×6.7×
Moon‐Hwan Chang · 1×
Citations per year

Countries citing papers authored by P. V. Varde

Since Specialization
Citations

This map shows the geographic impact of P. V. Varde's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. V. Varde with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. V. Varde more than expected).

Fields of papers citing papers by P. V. Varde

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by P. V. Varde. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. V. Varde. The network helps show where P. V. Varde may publish in the future.

Co-authors

The 25 scholars most cited alongside P. V. Varde, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with P. V. Varde Line = papers co-authored together P. V. Varde links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 62 papers — load more, or switch the sort, to bring in the rest.

#Work
1
Light emitting diodes reliability review
Hit paper breakdown →
2011647
2 201697
3 199837
4 201534
5 201328
6 202017
7 201917
8 201515
9 20209
10 20128
11 20178
12 20207
13 20186
14 20156
15 20146
16 20105
17 20185
18
Reliability analysis of protection system of advanced pressurized water reactor - APR 1400
20035
19 20124
20 20174

About P. V. Varde

P. V. Varde is a scholar working on Statistics, Probability and Uncertainty, Aerospace Engineering, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality and Control and Systems Engineering, having authored 62 papers that have together received 1.0k indexed citations. Recurring topics across this work include Risk and Safety Analysis (24 papers), Nuclear reactor physics and engineering (11 papers), Probabilistic and Robust Engineering Design (10 papers), Nuclear Engineering Thermal-Hydraulics (10 papers), Fault Detection and Control Systems (7 papers), Reliability and Maintenance Optimization (7 papers), Graphite, nuclear technology, radiation studies (5 papers) and Semiconductor materials and devices (5 papers). The work is most often cited by research in Condensed Matter Physics (310 citations), Statistics, Probability and Uncertainty (88 citations), Electrical and Electronic Engineering (492 citations), Bioengineering (47 citations) and Safety, Risk, Reliability and Quality (58 citations). P. V. Varde has collaborated with scholars based in India, United States and Norway. Frequent co-authors include Michael Pecht, Moon‐Hwan Chang, Diganta Das, Abhay Gusain, D. K. Aswal, Nirav Joshi, Ajit Kumar Verma, Syam Sankar, Alireza Ahmadi and Uday Kumar. Their work appears in journals such as Journal of Instrumentation, Springer series in reliability engineering, Review of Scientific Instruments, Sensors and Actuators B Chemical and Microelectronics Reliability.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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