P. J. Silvėrman
About
P. J. Silvėrman has authored 104 papers that have received a total of 4.3k indexed citations.
This includes 57 papers in Atomic and Molecular Physics, and Optics, 54 papers in Electrical and Electronic Engineering and 20 papers in Materials Chemistry. The topics of these papers are Semiconductor materials and devices (37 papers), Surface and Thin Film Phenomena (24 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers). P. J. Silvėrman is often cited by papers focused on Semiconductor materials and devices (37 papers), Surface and Thin Film Phenomena (24 papers) and Integrated Circuits and Semiconductor Failure Analysis (18 papers) and collaborates with scholars based in United States, Germany and Canada. P. J. Silvėrman's co-authors include Eugene A. Fitzgerald, L. C. Feldman, Y. Kuk, B. E. Weir and Ya‐Hong Xie and has published in prestigious journals such as Nature, Physical Review Letters and Applied Physics Letters.
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