P. Geittner
Impact in
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Semiconductor Lasers and Optical Devices 9
- Advanced Fiber Optic Sensors 7
- Semiconductor materials and devices 7
- Photonic Crystal and Fiber Optics 4
- Optical Network Technologies 4
- Plasma Diagnostics and Applications 3
-
- Copper Interconnects and Reliability 3
- Co-authors
- H. Lydtin (11 shared papers)Georg Gärtner (5 shared papers)A. Ritz (2 shared papers)D. Raasch (5 shared papers)D. Bäuerle (2 shared papers)Detlef Wiechert (2 shared papers)Peter K. Bachmann (5 shared papers)Georg Gaertner (1 shared paper)
In The Last Decade
P. Geittner
26 papers receiving 387 citations
Peers
Comparison fields: 5 of 51
- Surfaces, Coatings and Films 47
- Ceramics and Composites 27
- Electrical and Electronic Engineering 253
- Catalysis 30
- Materials Chemistry 151
Countries citing papers authored by P. Geittner
This map shows the geographic impact of P. Geittner's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by P. Geittner with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites P. Geittner more than expected).
Fields of papers citing papers by P. Geittner
This network shows the impact of papers produced by P. Geittner. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by P. Geittner. The network helps show where P. Geittner may publish in the future.
Co-authors
The 14 scholars most cited alongside P. Geittner, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 108 | |
| 2 | 1981 | 58 | |
| 3 | 1976 | 55 | |
| 4 | 1999 | 37 | |
| 5 | 1983 | 26 | |
| 6 | 1983 | 25 | |
| 7 | 2002 | 20 | |
| 8 | 1999 | 14 | |
| 9 | 1984 | 13 | |
| 10 | 1986 | 9 | |
| 11 | 1986 | 6 | |
| 12 | 1986 | 5 | |
| 13 | 2000 | 4 | |
| 14 | 1989 | 4 | |
| 15 | 1988 | 4 | |
| 16 | 1970 | 4 | |
| 17 | 1988 | 4 | |
| 18 | 2003 | 4 | |
| 19 | 2000 | 3 | |
| 20 | 1983 | 2 |
About P. Geittner
P. Geittner is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Materials Chemistry, having authored 27 papers that have together received 412 indexed citations. Recurring topics across this work include Semiconductor Lasers and Optical Devices (9 papers), Advanced Fiber Optic Sensors (7 papers), Semiconductor materials and devices (7 papers), Photonic Crystal and Fiber Optics (4 papers), Optical Network Technologies (4 papers), Copper Interconnects and Reliability (3 papers), Plasma Diagnostics and Applications (3 papers) and Electron and X-Ray Spectroscopy Techniques (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (47 citations), Ceramics and Composites (27 citations), Electrical and Electronic Engineering (253 citations), Catalysis (30 citations) and Materials Chemistry (151 citations). P. Geittner has collaborated with scholars based in Germany, Finland and Austria. Frequent co-authors include H. Lydtin, Georg Gärtner, A. Ritz, D. Raasch, D. Bäuerle, Detlef Wiechert, Peter K. Bachmann, Georg Gaertner, D. Leers and D. B�uerle. Their work appears in journals such as Applied Surface Science, Electronics Letters, Journal of Lightwave Technology, Applied Physics Letters and The European Physical Journal A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.