O.A. Baschenko
Impact in
- Surfaces, Coatings and Films top 1%
- Electron and X-Ray Spectroscopy Techniques
- Radiation top 2%
- X-ray Spectroscopy and Fluorescence Analysis
- Nuclear Physics and Applications
Papers in
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- Electron and X-Ray Spectroscopy Techniques 16
-
- X-ray Spectroscopy and Fluorescence Analysis 9
- Co-authors
- V. I. Nefedov (8 shared papers)А. И. Боронин (2 shared papers)J. Zemek (2 shared papers)V. I. Bukhtiyarov (2 shared papers)Hans Siegbahn (1 shared paper)P. Jiřı́ček (1 shared paper)A. Furlani (1 shared paper)M.V. Russo (1 shared paper)
In The Last Decade
O.A. Baschenko
17 papers receiving 445 citations
Peers
Comparison fields: 5 of 43
- Surfaces, Coatings and Films 410
- Radiation 256
- Atomic and Molecular Physics, and Optics 145
- Computational Mechanics 87
- Electrical and Electronic Engineering 222
Countries citing papers authored by O.A. Baschenko
This map shows the geographic impact of O.A. Baschenko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by O.A. Baschenko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites O.A. Baschenko more than expected).
Fields of papers citing papers by O.A. Baschenko
This network shows the impact of papers produced by O.A. Baschenko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by O.A. Baschenko. The network helps show where O.A. Baschenko may publish in the future.
Co-authors
The 13 scholars most cited alongside O.A. Baschenko, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1979 | 86 | |
| 2 | 1982 | 68 | |
| 3 | 1980 | 67 | |
| 4 | 1984 | 62 | |
| 5 | 1988 | 54 | |
| 6 | 1990 | 38 | |
| 7 | 1991 | 25 | |
| 8 | 1991 | 24 | |
| 9 | 1993 | 21 | |
| 10 | 1992 | 14 | |
| 11 | 1991 | 13 | |
| 12 | 1994 | 10 | |
| 13 | 1993 | 9 | |
| 14 | 1994 | 5 | |
| 15 | 1991 | 2 | |
| 16 | 1992 | 1 | |
| 17 | 1994 | 1 |
About O.A. Baschenko
O.A. Baschenko is a scholar working on Surfaces, Coatings and Films, Radiation, Electrical and Electronic Engineering, Computational Mechanics and Materials Chemistry, having authored 17 papers that have together received 500 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (16 papers), X-ray Spectroscopy and Fluorescence Analysis (9 papers), Semiconductor materials and devices (5 papers), Advancements in Photolithography Techniques (5 papers), Ion-surface interactions and analysis (4 papers), Surface and Thin Film Phenomena (3 papers), Corrosion Behavior and Inhibition (2 papers) and X-ray Diffraction in Crystallography (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (410 citations), Radiation (256 citations), Atomic and Molecular Physics, and Optics (145 citations), Computational Mechanics (87 citations) and Electrical and Electronic Engineering (222 citations). O.A. Baschenko has collaborated with scholars based in Russia, Bulgaria and Italy. Frequent co-authors include V. I. Nefedov, А. И. Боронин, J. Zemek, V. I. Bukhtiyarov, Hans Siegbahn, P. Jiřı́ček, A. Furlani, M.V. Russo, G. Polzonetti and F. Iacona. Their work appears in journals such as Journal of Electron Spectroscopy and Related Phenomena, Surface Science, Surface Review and Letters, Thin Solid Films and Analytical and Bioanalytical Chemistry.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.