Nicholas Fuller
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Plasma Diagnostics and Applications
- Integrated Circuits and Semiconductor Failure Analysis
- Mechanics of Materials top 5%
- Metal and Thin Film Mechanics
Papers in
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- Semiconductor materials and devices 28
- Advancements in Semiconductor Devices and Circuit Design 10
- Plasma Diagnostics and Applications 9
- Integrated Circuits and Semiconductor Failure Analysis 5
- 3D IC and TSV technologies 4
-
- Copper Interconnects and Reliability 15
- Co-authors
- Vincent M. Donnelly (8 shared papers)Irving P. Herman (8 shared papers)Mikhail V. Malyshev (4 shared papers)Katherine H. A. Bogart (2 shared papers)Timothy J. Dalton (6 shared papers)Marcus Andre Worsley (5 shared papers)Stacey F. Bent (5 shared papers)Michael Guillorn (6 shared papers)
- Journals
- Journal of Applied Physics (5 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (4 papers)Applied Physics Letters (3 papers)Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena (2 papers)Plasma Sources Science and Technology (2 papers)
- Partner nations
- United StatesJapanSwitzerland
In The Last Decade
Nicholas Fuller
42 papers receiving 1.4k citations
Peers
Comparison fields: 5 of 79
- Electrical and Electronic Engineering 1.2k
- Mechanics of Materials 326
- Electronic, Optical and Magnetic Materials 207
- Radiology, Nuclear Medicine and Imaging 150
- Hardware and Architecture 37
Countries citing papers authored by Nicholas Fuller
This map shows the geographic impact of Nicholas Fuller's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Nicholas Fuller with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Nicholas Fuller more than expected).
Fields of papers citing papers by Nicholas Fuller
This network shows the impact of papers produced by Nicholas Fuller. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Nicholas Fuller. The network helps show where Nicholas Fuller may publish in the future.
Co-authors
The 25 scholars most cited alongside Nicholas Fuller, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 46 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2009 | 256 | |
| 2 | 2000 | 134 | |
| 3 | 2000 | 112 | |
| 4 | 2014 | 103 | |
| 5 | 2009 | 81 | |
| 6 | 2005 | 76 | |
| 7 | 2001 | 71 | |
| 8 | 2008 | 71 | |
| 9 | 2008 | 53 | |
| 10 | 2002 | 50 | |
| 11 | 2006 | 47 | |
| 12 | 2002 | 43 | |
| 13 | 1999 | 39 | |
| 14 | 1997 | 38 | |
| 15 | 2012 | 36 | |
| 16 | 2012 | 30 | |
| 17 | 2007 | 29 | |
| 18 | 2017 | 22 | |
| 19 | 2006 | 20 | |
| 20 | 2013 | 17 |
About Nicholas Fuller
Nicholas Fuller is a scholar working on Electrical and Electronic Engineering, Electronic, Optical and Magnetic Materials, Mechanics of Materials, Biomedical Engineering and Spectroscopy, having authored 46 papers that have together received 1.5k indexed citations. Recurring topics across this work include Semiconductor materials and devices (28 papers), Copper Interconnects and Reliability (15 papers), Advancements in Semiconductor Devices and Circuit Design (10 papers), Plasma Diagnostics and Applications (9 papers), Metal and Thin Film Mechanics (8 papers), Integrated Circuits and Semiconductor Failure Analysis (5 papers), 3D IC and TSV technologies (4 papers) and Advanced Surface Polishing Techniques (4 papers). The work is most often cited by research in Electrical and Electronic Engineering (1.2k citations), Mechanics of Materials (326 citations), Electronic, Optical and Magnetic Materials (207 citations), Radiology, Nuclear Medicine and Imaging (150 citations) and Hardware and Architecture (37 citations). Nicholas Fuller has collaborated with scholars based in United States, Japan and Switzerland. Frequent co-authors include Vincent M. Donnelly, Irving P. Herman, Mikhail V. Malyshev, Katherine H. A. Bogart, Timothy J. Dalton, Marcus Andre Worsley, Stacey F. Bent, Michael Guillorn, Guy M. Cohen and J. Newbury. Their work appears in journals such as Journal of Applied Physics, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters, Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena and Plasma Sources Science and Technology.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.