M. Vaille

24 papers receiving 841 citations

Peers

M. Vaille
Comparison fields: 5 of 21
  • Condensed Matter Physics 789
  • Atomic and Molecular Physics, and Optics 46
  • Electrical and Electronic Engineering 49
  • Surfaces, Coatings and Films 5
  • Materials Chemistry 25
Replace Toshiya Tabuchi with:
Toshiya Tabuchi Japan
W. Van der Stricht Belgium
T. Boufaden Tunisia
E. T. Heyen Germany
Naoki Kase Japan
C. H. Chen Taiwan
Jyh-Rong Gong Taiwan
Kazuyoshi Tomita Japan
Hiroshi Tonomura Japan
J. A. Freitas United States
M. Vaille relative to Toshiya Tabuchi Japan Toshiya Tabuchi's profile →
Citations per field
00.5×1.5×1.8×
Toshiya Tabuchi · 1×
Citations per year

Countries citing papers authored by M. Vaille

Since Specialization
Citations

This map shows the geographic impact of M. Vaille's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. Vaille with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. Vaille more than expected).

Fields of papers citing papers by M. Vaille

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. Vaille. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. Vaille. The network helps show where M. Vaille may publish in the future.

Co-authors

The 25 scholars most cited alongside M. Vaille, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. Vaille Line = papers co-authored together M. Vaille links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 24 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2000163
2 1998112
3 200078
4 199768
5 199859
6 199754
7 199752
8 199939
9 200236
10 199833
11 199831
12 199921
13 200221
14 198617
15 198816
16 199615
17 199712
18 200210
19 20019
20 20019

About M. Vaille

M. Vaille is a scholar working on Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Spectroscopy and Biomedical Engineering, having authored 24 papers that have together received 869 indexed citations. Recurring topics across this work include GaN-based semiconductor devices and materials (23 papers), Semiconductor materials and devices (2 papers), Semiconductor materials and interfaces (2 papers), Plasma Diagnostics and Applications (1 paper), Acoustic Wave Resonator Technologies (1 paper), Spectroscopy and Laser Applications (1 paper) and Advanced Semiconductor Detectors and Materials (1 paper). The work is most often cited by research in Condensed Matter Physics (789 citations), Atomic and Molecular Physics, and Optics (46 citations), Electrical and Electronic Engineering (49 citations), Surfaces, Coatings and Films (5 citations) and Materials Chemistry (25 citations). M. Vaille has collaborated with scholars based in France, Germany and Tunisia. Frequent co-authors include Pierre J. L. Gibart, Bernard Beaumont, Philippe Vennéguès, S. Haffouz, Valerie Bousquet, Marguerite Laügt, Gilles Nataf, H. Lahrèche, T. Boufaden and Belgacem El Jani. Their work appears in journals such as Journal of Crystal Growth, physica status solidi (a), Journal of Applied Physics, Applied Physics Letters and MRS Internet Journal of Nitride Semiconductor Research.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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