M. A. O’Keefe

2.6k citations

80 papers · 2.2k · h-index 25

Impact in

Structural Biology top 0.2%
- Advanced Electron Microscopy Techniques and Applications
Surfaces, Coatings and Films top 0.5%
- Electron and X-Ray Spectroscopy Techniques

Papers in

Surfaces, Coatings and Films 32
- Electron and X-Ray Spectroscopy Techniques 32
Structural Biology 31
- Advanced Electron Microscopy Techniques and Applications 31

Co-authors: D. F. Lynch (3 shared papers)Peter R. Buseck (2 shared papers)John E. Northrup (2 shared papers)Lucia Romano (2 shared papers)David J. Smith (7 shared papers)Sumio Iijima (3 shared papers)E. N. Maslen (2 shared papers)A.G. Fox (2 shared papers)
Journals: Microscopy and Microanalysis (14 papers)Ultramicroscopy (7 papers)Applied Physics Letters (3 papers)Journal of Microscopy (2 papers)Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties (2 papers)
Partner nations: United States United Kingdom Germany

In The Last Decade

M. A. O’Keefe

78 papers receiving 2.1k citations

Peers

Replace A. F. Moodie with:

A. F. Moodie Australia

Kazuo Ishizuka Japan

D. E. Jesson United States

Michiyoshi Tanaka Japan

B. Jouffrey France

A. Thust Germany

G. Materlik Germany

T. H. Metzger France

G. Materlik Germany

Philip E. Batson United States

M. A. O’Keefe relative to A. F. Moodie Australia A. F. Moodie's profile →

Citations per field

00.5×1.5×

A. F. Moodie · 1×

×0.7 738/999

SB

×0.7 682/1k

SCF

×0.8 482/593

CMP

×0.5 294/565

RADIA

×0.7 899/1k

MC

Citations per year

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Countries citing papers authored by M. A. O’Keefe

Since Specialization

Citations

This map shows the geographic impact of M. A. O’Keefe's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by M. A. O’Keefe with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites M. A. O’Keefe more than expected).

Fields of papers citing papers by M. A. O’Keefe

Since Specialization

Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by M. A. O’Keefe. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by M. A. O’Keefe. The network helps show where M. A. O’Keefe may publish in the future.

Co-authors

The 25 scholars most cited alongside M. A. O’Keefe, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with M. A. O’Keefe Line = papers co-authored together M. A. O’Keefe links everyone, so they are left out of the graph.

All Works

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20 of 20 papers shown

Showing the 20 most-cited of 80 papers — load more, or switch the sort, to bring in the rest.

#	Work
1	Inversion domains in GaN grown on sapphire Applied Physics Letters ·Lucia Romano, John E. Northrup, M. A. O’Keefe	1996	195
2	Intensity of diffracted intensities International Tables for Crystallography ·P. Brown, A.G. Fox, E. N. Maslen, M. A. O’Keefe, Β. Τ. M. Willis	2006	179
3	The importance of beam alignment and crystal tilt in high resolution electron microscopy Ultramicroscopy ·David J. Smith, W. O. Saxton, M. A. O’Keefe, George Wood, W. M. Stobbs	1983	141
4	Computed crystal structure images for high resolution electron microscopy Nature ·M. A. O’Keefe, Peter R. Buseck, Sumio Iijima	1978	122
5	Imaging columns of the light elements carbon, nitrogen and oxygen with sub Ångstrom resolution Ultramicroscopy ·Christian Kisielowski, Crispin Hetherington, Y.C. Wang, R. Kilaas, M. A. O’Keefe, A. Thust	2001	119
6	Practical computation of amplitudes and phases in electron diffraction Ultramicroscopy ·Peter Self, M. A. O’Keefe, Peter R. Buseck, A.E.C. Spargo	1983	108
7	n-Beam lattice images. V. The use of the charge-density approximation in the interpretation of lattice images Acta Crystallographica Section A ·D. F. Lynch, A. F. Moodie, M. A. O’Keefe	1975	107
8	Sub-Ångstrom high-resolution transmission electron microscopy at 300keV Ultramicroscopy ·M. A. O’Keefe, Crispin Hetherington, Yi‐Ching Wang, E. Chris Nelson, J. Harvey Turner, Christian Kisielowski, J.‐O. Malm, Rolf Mueller, J. Ringnalda, Mingming Pan, A. Thust	2001	101
9	Deceptive “lattice spacings” in high-resolution micrographs of metal nanoparticles Ultramicroscopy ·J.‐O. Malm, M. A. O’Keefe	1997	77
10	n-Beam lattice images. II. Methods of calculation Acta Crystallographica Section A ·D. F. Lynch, M. A. O’Keefe	1972	66
11	Electron microscopy at 1-Å resolution by entropy maximization and likelihood ranking Nature ·Wei Dong, T. Baird, J. R. Fryer, C. J. Gilmore, David D. MacNicol, G. Bricogne, David J. Smith, M. A. O’Keefe, Sven Hovmöller	1992	65
12	n-Beam lattice images. IV. Computed two-dimensional images Acta Crystallographica Section A ·M. A. O’Keefe	1973	60
13	Scattering-factor interpolation E. N. Maslen, AG Fox, M. A. O’Keefe	2006	53
14	The high resolution electron microscopy of stacking defects in Cu–Zn–Al shape memory alloy Journal of Microscopy ·J. M. Cook, M. A. O’Keefe, David J. Smith, W. M. Stobbs	1983	47
15	n-Beam lattice images. VI. Degradation of image resolution by a combination of incident-beam divergence and spherical aberration Acta Crystallographica Section A ·M. A. O’Keefe, J. V. Sanders	1975	46
16	Relativistic Hartree–Fock X-ray and electron atomic scattering factors at high angles Acta Crystallographica Section A Foundations of Crystallography ·A.G. Fox, M. A. O’Keefe, Mark A. Tabbernor	1989	46
17	n-Beam lattice images. III. Upper limits of ionicity in W₄Nb₂₆O₇₇ Acta Crystallographica Section A ·G. R. Anstis, D. F. Lynch, A. F. Moodie, M. A. O’Keefe	1973	44
18	Atomic structure of a Σ99 grain boundary in aluminium: A comparison between atomic-resolution observation and pair-potential and embedded-atom simulations Philosophical Magazine Letters ·U. Dahmen, C. J. D. Hetheringtont, M. A. O’Keefe, K. H. Westmacottt, Michael J. Mills, Murray S. Daw, V. Vítek	1990	43
19	Atomic Structure of Defects in GaN:Mg Grown with Ga Polarity Physical Review Letters ·Z. Liliental‐Weber, T. Tomaszewicz, Dmitri N. Zakharov, Jacek B. Jasiński, M. A. O’Keefe	2004	38
20	Summary Abstract: High resolution electron microscopy of CaF2/silicon interfaces Journal of Vacuum Science & Technology B Microelectronics Processing and Phenomena ·F. A. Ponce, G. B. Anderson, M. A. O’Keefe, L. J. Schowalter	1986	34

About M. A. O’Keefe

M. A. O’Keefe is a scholar working on Surfaces, Coatings and Films, Structural Biology, Materials Chemistry, Electrical and Electronic Engineering and Radiation, having authored 80 papers that have together received 2.2k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (32 papers), Advanced Electron Microscopy Techniques and Applications (31 papers), Advancements in Photolithography Techniques (13 papers), X-ray Diffraction in Crystallography (12 papers), Advanced X-ray Imaging Techniques (9 papers), Semiconductor materials and devices (7 papers), GaN-based semiconductor devices and materials (7 papers) and Advanced Materials Characterization Techniques (6 papers). The work is most often cited by research in Structural Biology (738 citations), Surfaces, Coatings and Films (682 citations), Condensed Matter Physics (482 citations), Radiation (294 citations) and Materials Chemistry (899 citations). M. A. O’Keefe has collaborated with scholars based in United States, United Kingdom and Germany. Frequent co-authors include D. F. Lynch, Peter R. Buseck, John E. Northrup, Lucia Romano, David J. Smith, Sumio Iijima, E. N. Maslen, A.G. Fox, J.‐O. Malm and A. F. Moodie. Their work appears in journals such as Microscopy and Microanalysis, Ultramicroscopy, Applied Physics Letters, Journal of Microscopy and Philosophical magazine. A/Philosophical magazine. A. Physics of condensed matter. Structure, defects and mechanical properties.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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M. A. O’Keefe

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