Keith Jackson
Impact in
- Radiation top 10%
- Advanced X-ray Imaging Techniques
- Surfaces, Coatings and Films top 10%
- Electron and X-Ray Spectroscopy Techniques
Papers in
-
- Advancements in Photolithography Techniques 22
- Integrated Circuits and Semiconductor Failure Analysis 7
- Radiation 13
- Advanced X-ray Imaging Techniques 13
- Co-authors
- Kenneth A. Goldberg (19 shared papers)Patrick Naulleau (16 shared papers)Paul Denham (12 shared papers)Erik H. Anderson (12 shared papers)Senajith Rekawa (8 shared papers)Jeffrey Bokor (12 shared papers)J. Alexander Liddle (6 shared papers)David Attwood (5 shared papers)
- Journals
- Journal of Micromechanics and Microengineering (1 paper)Sensors and Materials (1 paper)Journal of Vacuum Science and Technology (1 paper)arXiv (Cornell University) (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (11 papers)
- Partner nations
- United States
In The Last Decade
Keith Jackson
27 papers receiving 242 citations
Peers
Comparison fields: 5 of 52
- Radiation 88
- Surfaces, Coatings and Films 61
- Structural Biology 6
- Electrical and Electronic Engineering 173
- Computer Vision and Pattern Recognition 55
Countries citing papers authored by Keith Jackson
This map shows the geographic impact of Keith Jackson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Keith Jackson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Keith Jackson more than expected).
Fields of papers citing papers by Keith Jackson
This network shows the impact of papers produced by Keith Jackson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Keith Jackson. The network helps show where Keith Jackson may publish in the future.
Co-authors
The 25 scholars most cited alongside Keith Jackson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 29 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1995 | 41 | |
| 2 | 1993 | 32 | |
| 3 | 2004 | 29 | |
| 4 | 2004 | 26 | |
| 5 | 1997 | 19 | |
| 6 | 1996 | 17 | |
| 7 | 2004 | 16 | |
| 8 | 2005 | 9 | |
| 9 | 2001 | 9 | |
| 10 | 2021 | 8 | |
| 11 | 2003 | 7 | |
| 12 | 2001 | 7 | |
| 13 | 2005 | 6 | |
| 14 | 2003 | 4 | |
| 15 | 1996 | 4 | |
| 16 | 1994 | 4 | |
| 17 | 2003 | 3 | |
| 18 | 1995 | 3 | |
| 19 | 2003 | 3 | |
| 20 | 2003 | 2 |
About Keith Jackson
Keith Jackson is a scholar working on Electrical and Electronic Engineering, Radiation, Computer Vision and Pattern Recognition, Surfaces, Coatings and Films and Biomedical Engineering, having authored 29 papers that have together received 257 indexed citations. Recurring topics across this work include Advancements in Photolithography Techniques (22 papers), Advanced X-ray Imaging Techniques (13 papers), Optical measurement and interference techniques (9 papers), Electron and X-Ray Spectroscopy Techniques (7 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Advanced Surface Polishing Techniques (4 papers), Adaptive optics and wavefront sensing (4 papers) and Advanced Measurement and Metrology Techniques (3 papers). The work is most often cited by research in Radiation (88 citations), Surfaces, Coatings and Films (61 citations), Structural Biology (6 citations), Electrical and Electronic Engineering (173 citations) and Computer Vision and Pattern Recognition (55 citations). Keith Jackson has collaborated with scholars based in United States. Frequent co-authors include Kenneth A. Goldberg, Patrick Naulleau, Paul Denham, Erik H. Anderson, Senajith Rekawa, Jeffrey Bokor, J. Alexander Liddle, David Attwood, Chantal G. Khan Malek and Tsun‐Hsu Chang. Their work appears in journals such as Journal of Micromechanics and Microengineering, Sensors and Materials, Journal of Vacuum Science and Technology, arXiv (Cornell University) and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.