K. Ulmer

1.1k citations
23 papers · 198 · h-index 8

Impact in

Papers in

K. Ulmer

22 papers receiving 186 citations

Peers

K. Ulmer
Comparison fields: 5 of 36
  • Surfaces, Coatings and Films 107
  • Radiation 85
  • Atomic and Molecular Physics, and Optics 86
  • Condensed Matter Physics 29
  • Physical and Theoretical Chemistry 13
Replace H. Glaefeke with:
H. Glaefeke Germany
H. Nagasawa Germany
H. F. Roloff Austria
O. B. Sokolov Russia
S. P. Singhal United States
В. И. Гребенников Russia
H. Miosga Germany
E. So United States
B. De Michelis Italy
P. S. Mangat United States
K. Ulmer relative to H. Glaefeke Germany H. Glaefeke's profile →
Citations per field
00.5×3.2×
H. Glaefeke · 1×
Citations per year

Countries citing papers authored by K. Ulmer

Since Specialization
Citations

This map shows the geographic impact of K. Ulmer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by K. Ulmer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites K. Ulmer more than expected).

Fields of papers citing papers by K. Ulmer

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by K. Ulmer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by K. Ulmer. The network helps show where K. Ulmer may publish in the future.

Co-authors

The 7 scholars most cited alongside K. Ulmer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with K. Ulmer Line = papers co-authored together K. Ulmer links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 23 papers — load more, or switch the sort, to bring in the rest.

#Work
1 196831
2 196826
3 196625
4 196918
5 196918
6 196713
7 197112
8 195812
9 19685
10 19805
11 19675
12 19664
13 19624
14 19754
15 19763
16 19733
17 19643
18 19572
19 19772
20 19601

About K. Ulmer

K. Ulmer is a scholar working on Surfaces, Coatings and Films, Materials Chemistry, Atomic and Molecular Physics, and Optics, Radiation and Electrical and Electronic Engineering, having authored 23 papers that have together received 198 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (12 papers), X-ray Diffraction in Crystallography (6 papers), X-ray Spectroscopy and Fluorescence Analysis (6 papers), Advanced Materials Characterization Techniques (3 papers), Surface and Thin Film Phenomena (2 papers), Advancements in Photolithography Techniques (2 papers), Semiconductor materials and devices (2 papers) and Mass Spectrometry Techniques and Applications (2 papers). The work is most often cited by research in Surfaces, Coatings and Films (107 citations), Radiation (85 citations), Atomic and Molecular Physics, and Optics (86 citations), Condensed Matter Physics (29 citations) and Physical and Theoretical Chemistry (13 citations). K. Ulmer has collaborated with scholars based in Germany. Frequent co-authors include H. Merz, P. Staib, Frank T. Edelmann, H. Vernickel, H. Claus, F. Riehle and B. N. Dev. Their work appears in journals such as The European Physical Journal A, Physics Letters A, physica status solidi (b), Die Naturwissenschaften and Journal of Crystal Growth.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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