Jon Orloff
Impact in
- Structural Biology top 1%
- Advanced Electron Microscopy Techniques and Applications
- Surfaces, Coatings and Films top 5%
- Electron and X-Ray Spectroscopy Techniques
Papers in
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- Integrated Circuits and Semiconductor Failure Analysis 10
- Advancements in Photolithography Techniques 4
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- Electron and X-Ray Spectroscopy Techniques 20
- Co-authors
- L. W. Swanson (9 shared papers)M. Utlaut (8 shared papers)Chandrabhas Narayana (3 shared papers)Arthur L. Ruoff (3 shared papers)Huan Luo (1 shared paper)Jabez J. McClelland (2 shared papers)Xuefeng Liu (1 shared paper)Samuel H. Moseley (3 shared papers)
- Journals
- Review of Scientific Instruments (2 papers)Microelectronic Engineering (2 papers)Ultramicroscopy (1 paper)Nano Letters (1 paper)Scientific American (1 paper)
- Partner nations
- United StatesChinaAustralia
In The Last Decade
Jon Orloff
37 papers receiving 1.0k citations
Peers
Comparison fields: 5 of 72
- Structural Biology 158
- Surfaces, Coatings and Films 190
- Computational Mechanics 418
- Geophysics 200
- Atomic and Molecular Physics, and Optics 314
Countries citing papers authored by Jon Orloff
This map shows the geographic impact of Jon Orloff's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Jon Orloff with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Jon Orloff more than expected).
Fields of papers citing papers by Jon Orloff
This network shows the impact of papers produced by Jon Orloff. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Jon Orloff. The network helps show where Jon Orloff may publish in the future.
Co-authors
The 25 scholars most cited alongside Jon Orloff, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 40 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1993 | 289 | |
| 2 | 2003 | 231 | |
| 3 | 1998 | 210 | |
| 4 | 1996 | 82 | |
| 5 | 2002 | 81 | |
| 6 | 2008 | 49 | |
| 7 | 1997 | 14 | |
| 8 | 2005 | 13 | |
| 9 | 1999 | 13 | |
| 10 | 2003 | 11 | |
| 11 | 1991 | 10 | |
| 12 | 2000 | 10 | |
| 13 | 1990 | 9 | |
| 14 | 2003 | 9 | |
| 15 | 2000 | 9 | |
| 16 | 2010 | 9 | |
| 17 | 1985 | 6 | |
| 18 | 1987 | 6 | |
| 19 | 2005 | 6 | |
| 20 | 2003 | 6 |
About Jon Orloff
Jon Orloff is a scholar working on Electrical and Electronic Engineering, Surfaces, Coatings and Films, Computational Mechanics, Biomedical Engineering and Structural Biology, having authored 40 papers that have together received 1.1k indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (20 papers), Ion-surface interactions and analysis (17 papers), Integrated Circuits and Semiconductor Failure Analysis (10 papers), Advanced Electron Microscopy Techniques and Applications (8 papers), Diamond and Carbon-based Materials Research (7 papers), Advanced Materials Characterization Techniques (6 papers), Advancements in Photolithography Techniques (4 papers) and Mass Spectrometry Techniques and Applications (4 papers). The work is most often cited by research in Structural Biology (158 citations), Surfaces, Coatings and Films (190 citations), Computational Mechanics (418 citations), Geophysics (200 citations) and Atomic and Molecular Physics, and Optics (314 citations). Jon Orloff has collaborated with scholars based in United States, China and Australia. Frequent co-authors include L. W. Swanson, M. Utlaut, Chandrabhas Narayana, Arthur L. Ruoff, Huan Luo, Jabez J. McClelland, Xuefeng Liu, Samuel H. Moseley, A. Kutyrev and J. Melngailis. Their work appears in journals such as Review of Scientific Instruments, Microelectronic Engineering, Ultramicroscopy, Nano Letters and Scientific American.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.