John White
Impact in
- Bioengineering top 5%
- Analytical Chemistry and Sensors
- Electrochemistry top 5%
- Electrochemical Analysis and Applications
Papers in
-
- Electrodeposition and Electroless Coatings 2
- Electronic Packaging and Soldering Technologies 2
- Advanced MEMS and NEMS Technologies 1
- Electrochemical sensors and biosensors 1
-
- Corrosion Behavior and Inhibition 1
- Co-authors
- Dennis Tench (3 shared papers)L. F. Warren (1 shared paper)R. Noufi (1 shared paper)Arthur J. Nozik (1 shared paper)Carlo Carraro (1 shared paper)Frank W. DelRio (1 shared paper)M. Kendig (1 shared paper)Roya Maboudian (1 shared paper)
- Journals
- Journal of The Electrochemical Society (2 papers)Journal of Applied Electrochemistry (1 paper)Sensors and Actuators A Physical (1 paper)Metallurgical Transactions A (1 paper)
- Partner nations
- United States
In The Last Decade
John White
5 papers receiving 385 citations
Peers
Comparison fields: 5 of 33
- Bioengineering 121
- Electrochemistry 105
- Polymers and Plastics 220
- Electrical and Electronic Engineering 260
- Mechanics of Materials 59
Countries citing papers authored by John White
This map shows the geographic impact of John White's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John White with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John White more than expected).
Fields of papers citing papers by John White
This network shows the impact of papers produced by John White. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John White. The network helps show where John White may publish in the future.
Co-authors
The 9 scholars most cited alongside John White, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1982 | 244 | |
| 2 | 1984 | 133 | |
| 3 | 2007 | 17 | |
| 4 | 1985 | 8 | |
| 5 | 1985 | 5 |
About John White
John White is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Electrochemistry, Atomic and Molecular Physics, and Optics and Polymers and Plastics, having authored 5 papers that have together received 407 indexed citations. Recurring topics across this work include Electrodeposition and Electroless Coatings (2 papers), Electronic Packaging and Soldering Technologies (2 papers), Electrochemical Analysis and Applications (2 papers), Corrosion Behavior and Inhibition (1 paper), Advanced Chemical Sensor Technologies (1 paper), Advanced MEMS and NEMS Technologies (1 paper), Electrochemical sensors and biosensors (1 paper) and Conducting polymers and applications (1 paper). The work is most often cited by research in Bioengineering (121 citations), Electrochemistry (105 citations), Polymers and Plastics (220 citations), Electrical and Electronic Engineering (260 citations) and Mechanics of Materials (59 citations). John White has collaborated with scholars based in United States. Frequent co-authors include Dennis Tench, L. F. Warren, R. Noufi, Arthur J. Nozik, Carlo Carraro, Frank W. DelRio, M. Kendig, Roya Maboudian and D. P. Anderson. Their work appears in journals such as Journal of The Electrochemical Society, Journal of Applied Electrochemistry, Sensors and Actuators A Physical and Metallurgical Transactions A.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.