John Sheil

36 papers receiving 516 citations

Peers

John Sheil
Comparison fields: 5 of 40
  • Mechanics of Materials 338
  • Nuclear and High Energy Physics 167
  • Atomic and Molecular Physics, and Optics 371
  • Computational Mechanics 124
  • Radiation 42
Replace Yezheng Tao with:
Yezheng Tao United States
Fergal O’Reilly Ireland
Brendan A. Reagan United States
T. Okuno Japan
Randy A. Meijer Netherlands
Francesco Torretti Netherlands
Ruben Schupp Netherlands
Vivek Bakshi United States
Anthony Valenzuela United States
К.А. Иванов Russia
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Citations per field
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Citations per year

Countries citing papers authored by John Sheil

Since Specialization
Citations

This map shows the geographic impact of John Sheil's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Sheil with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Sheil more than expected).

Fields of papers citing papers by John Sheil

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John Sheil. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Sheil. The network helps show where John Sheil may publish in the future.

Co-authors

The 25 scholars most cited alongside John Sheil, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John Sheil Line = papers co-authored together John Sheil links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.

#Work
1 202097
2 202055
3 202248
4 201930
5 202029
6 202128
7 201526
8 202225
9 202124
10 202123
11 202319
12 202017
13 202315
14 202214
15 201714
16 202013
17 20219
18 20249
19 20238
20 20187

About John Sheil

John Sheil is a scholar working on Atomic and Molecular Physics, and Optics, Mechanics of Materials, Nuclear and High Energy Physics, Computational Mechanics and Radiation, having authored 36 papers that have together received 551 indexed citations. Recurring topics across this work include Laser-induced spectroscopy and plasma (28 papers), Atomic and Molecular Physics (25 papers), Laser-Plasma Interactions and Diagnostics (12 papers), Laser-Matter Interactions and Applications (10 papers), Laser Material Processing Techniques (6 papers), X-ray Spectroscopy and Fluorescence Analysis (5 papers), Ion-surface interactions and analysis (4 papers) and Mass Spectrometry Techniques and Applications (2 papers). The work is most often cited by research in Mechanics of Materials (338 citations), Nuclear and High Energy Physics (167 citations), Atomic and Molecular Physics, and Optics (371 citations), Computational Mechanics (124 citations) and Radiation (42 citations). John Sheil has collaborated with scholars based in Netherlands, Ireland and Russia. Frequent co-authors include O. O. Versolato, R. Hoekstra, W. Ubachs, Stefan Witte, Ruben Schupp, Muharrem Bayraktar, Randy A. Meijer, M. M. Basko, Francesco Torretti and J. Colgan. Their work appears in journals such as Applied Physics Letters, Physics of Plasmas, Journal of Physics B Atomic Molecular and Optical Physics, Physical review. A and Plasma Sources Science and Technology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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