John S. Chun

48 papers receiving 1.0k citations

Peers

John S. Chun
Comparison fields: 5 of 53
  • Ceramics and Composites 226
  • Mechanics of Materials 320
  • Materials Chemistry 571
  • Electrical and Electronic Engineering 596
  • Electronic, Optical and Magnetic Materials 181
Replace Frederick F. Lange with:
Frederick F. Lange United States
E. Çelik Türkiye
Jörg Woltersdorf Germany
Hyung‐Jin Jung South Korea
Nobuyuki Tamari Japan
Claude Esnouf France
C.E. Foerster Brazil
Tatsuo Noma Japan
R. Ghisleni Switzerland
Edward P. Gorzkowski United States
John S. Chun relative to Frederick F. Lange United States Frederick F. Lange's profile →
Citations per field
00.5×
Frederick F. Lange · 1×
Citations per year

Countries citing papers authored by John S. Chun

Since Specialization
Citations

This map shows the geographic impact of John S. Chun's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John S. Chun with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John S. Chun more than expected).

Fields of papers citing papers by John S. Chun

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John S. Chun. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John S. Chun. The network helps show where John S. Chun may publish in the future.

Co-authors

The 25 scholars most cited alongside John S. Chun, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John S. Chun Line = papers co-authored together John S. Chun links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 50 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1994122
2 198697
3 199573
4 202073
5 199557
6 198850
7 199744
8 199043
9 198242
10 199434
11 199534
12 198331
13 198429
14 198228
15 198326
16 198925
17 198219
18 198818
19 199615
20 198615

About John S. Chun

John S. Chun is a scholar working on Electrical and Electronic Engineering, Mechanics of Materials, Materials Chemistry, Electronic, Optical and Magnetic Materials and Mechanical Engineering, having authored 50 papers that have together received 1.1k indexed citations. Recurring topics across this work include Metal and Thin Film Mechanics (24 papers), Semiconductor materials and devices (18 papers), Copper Interconnects and Reliability (14 papers), Advanced materials and composites (9 papers), ZnO doping and properties (8 papers), Advanced ceramic materials synthesis (6 papers), High-Temperature Coating Behaviors (5 papers) and Semiconductor materials and interfaces (5 papers). The work is most often cited by research in Ceramics and Composites (226 citations), Mechanics of Materials (320 citations), Materials Chemistry (571 citations), Electrical and Electronic Engineering (596 citations) and Electronic, Optical and Magnetic Materials (181 citations). John S. Chun has collaborated with scholars based in South Korea and United States. Frequent co-authors include Kyoung‐Ho Kim, Hyung‐Ho Park, Yong Chun Kim, S.W. Nam, Jae Gon Kim, Chulsoon Park, Il Kim, Chi‐Wan Lee, Kwangsoo No and Jongseok Kim. Their work appears in journals such as Thin Solid Films, Journal of Materials Science, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Applied Physics Letters and Journal of materials research/Pratt's guide to venture capital sources.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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