John M. Dell

3.7k citations
257 papers · 3.0k · h-index 28

Impact in

Papers in

John M. Dell

234 papers receiving 2.9k citations

Peers

John M. Dell
Comparison fields: 5 of 75
  • Electrical and Electronic Engineering 2.2k
  • Atomic and Molecular Physics, and Optics 1.2k
  • Condensed Matter Physics 411
  • Instrumentation 97
  • Mechanics of Materials 513
Replace M. Ettenberg with:
M. Ettenberg United States
Roger Van Overstraeten Belgium
Kazumi Wada Japan
Jens W. Tomm Germany
Joseph G. Tischler United States
S. N. G. Chu United States
Soon Fatt Yoon Singapore
P Juodawlkis United States
Rachael L. Myers‐Ward United States
Iain G. Thayne United Kingdom
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Citations per field
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Citations per year

Countries citing papers authored by John M. Dell

Since Specialization
Citations

This map shows the geographic impact of John M. Dell's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John M. Dell with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John M. Dell more than expected).

Fields of papers citing papers by John M. Dell

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John M. Dell. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John M. Dell. The network helps show where John M. Dell may publish in the future.

Co-authors

The 25 scholars most cited alongside John M. Dell, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John M. Dell Line = papers co-authored together John M. Dell links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 257 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2006170
2 2000120
3 201097
4 200395
5 200993
6 200987
7 200563
8 200262
9 200961
10 200550
11 200046
12 199743
13 201443
14 200139
15 200539
16 201538
17 201237
18 201633
19 201632
20 199632

About John M. Dell

John M. Dell is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Mechanics of Materials, Condensed Matter Physics and Biomedical Engineering, having authored 257 papers that have together received 3.0k indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (93 papers), Semiconductor Quantum Structures and Devices (59 papers), Photonic and Optical Devices (52 papers), Advanced MEMS and NEMS Technologies (50 papers), Chalcogenide Semiconductor Thin Films (44 papers), Semiconductor materials and devices (37 papers), Metal and Thin Film Mechanics (26 papers) and Mechanical and Optical Resonators (26 papers). The work is most often cited by research in Electrical and Electronic Engineering (2.2k citations), Atomic and Molecular Physics, and Optics (1.2k citations), Condensed Matter Physics (411 citations), Instrumentation (97 citations) and Mechanics of Materials (513 citations). John M. Dell has collaborated with scholars based in Australia, United States and Poland. Frequent co-authors include Lorenzo Faraone, Charles A. Musca, Jarek Antoszewski, ADRIAN J. KEATING, Kevin J. Winchester, Han Huang, Mariusz P. Martyniuk, Giacinta Parish, Yinong Liu and Brett Nener. Their work appears in journals such as Journal of Electronic Materials, Journal of Applied Physics, Journal of Microelectromechanical Systems, Applied Physics Letters and Semiconductor Science and Technology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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