John Kuffel

30 papers receiving 673 citations

Peers

John Kuffel
Comparison fields: 5 of 60
  • Control and Systems Engineering 255
  • Materials Chemistry 460
  • Astronomy and Astrophysics 153
  • Electrical and Electronic Engineering 434
  • Aerospace Engineering 145
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Bing Yang Luo China
Stephen A. Sebo United States
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Samir Ahmed Al-Gailani Malaysia
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Behzad Kordi Canada
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Citations per year

Countries citing papers authored by John Kuffel

Since Specialization
Citations

This map shows the geographic impact of John Kuffel's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John Kuffel with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John Kuffel more than expected).

Fields of papers citing papers by John Kuffel

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by John Kuffel. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John Kuffel. The network helps show where John Kuffel may publish in the future.

Co-authors

The 25 scholars most cited alongside John Kuffel, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with John Kuffel Line = papers co-authored together John Kuffel links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 33 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2008137
2 200079
3 199659
4 199658
5 200555
6 201449
7 198946
8 200538
9 198731
10 199330
11 198725
12 200015
13 199113
14
The Icing Stress Product : A Measure for Testing and Design of Outdoor Insulators in Freezing Conditions
200011
15 200011
16 19908
17 20008
18 20007
19 20137
20 19896

About John Kuffel

John Kuffel is a scholar working on Control and Systems Engineering, Materials Chemistry, Electrical and Electronic Engineering, Astronomy and Astrophysics and Mechanical Engineering, having authored 33 papers that have together received 718 indexed citations. Recurring topics across this work include High voltage insulation and dielectric phenomena (17 papers), Thermal Analysis in Power Transmission (11 papers), Power Transformer Diagnostics and Insulation (8 papers), Advanced Electrical Measurement Techniques (6 papers), Lightning and Electromagnetic Phenomena (5 papers), Electrical Fault Detection and Protection (3 papers), Icing and De-icing Technologies (3 papers) and Non-Destructive Testing Techniques (3 papers). The work is most often cited by research in Control and Systems Engineering (255 citations), Materials Chemistry (460 citations), Astronomy and Astrophysics (153 citations), Electrical and Electronic Engineering (434 citations) and Aerospace Engineering (145 citations). John Kuffel has collaborated with scholars based in Canada, Switzerland and United States. Frequent co-authors include W.S. Zaengl, Edmund Kuffel, Terence R. McComb, Ryszard A. Malewski, William A. Chisholm, A.J. Phillips, Edward A. Cherney, A. C. Baker, M. Farzaneh and Wasyl Janischewskyj. Their work appears in journals such as IEEE Transactions on Power Delivery, IEEE Transactions on Instrumentation and Measurement, IEEE Electrical Insulation Magazine, IEEE Power Engineering Review and Elsevier eBooks.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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