John J. Lander
Impact in
- Surfaces, Coatings and Films top 0.2%
- Electron and X-Ray Spectroscopy Techniques
-
- Surface and Thin Film Phenomena
- Semiconductor materials and interfaces
Papers in
-
- Electron and X-Ray Spectroscopy Techniques 11
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- Surface and Thin Film Phenomena 17
- Semiconductor materials and interfaces 5
- Co-authors
- John H. Morrison (14 shared papers)John H. Morrison (4 shared papers)D. G. Thomas (4 shared papers)H. E. Kern (1 shared paper)Garth W. Gobeli (2 shared papers)Keanu Müller (2 shared papers)James Christopher Phillips (1 shared paper)Paul Delahay (1 shared paper)
- Journals
- Journal of The Electrochemical Society (11 papers)Surface Science (10 papers)Journal of Applied Physics (10 papers)Journal of Physics and Chemistry of Solids (4 papers)Journal of the American Chemical Society (4 papers)
- Partner nations
- United States
In The Last Decade
John J. Lander
55 papers receiving 3.7k citations
John J. Lander's Hit Papers
Peers
Comparison fields: 5 of 70
- Surfaces, Coatings and Films 855
- Atomic and Molecular Physics, and Optics 1.8k
- Materials Chemistry 1.1k
- General Materials Science 37
- Catalysis 64
Countries citing papers authored by John J. Lander
This map shows the geographic impact of John J. Lander's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by John J. Lander with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites John J. Lander more than expected).
Fields of papers citing papers by John J. Lander
This network shows the impact of papers produced by John J. Lander. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by John J. Lander. The network helps show where John J. Lander may publish in the future.
Co-authors
The 19 scholars most cited alongside John J. Lander, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 56 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Auger Peaks in the Energy Spectra of Secondary Electrons from Various Materials Hit paper breakdown → | 1953 | 337 |
| 2 | 1964 | 272 | |
| 3 | 1956 | 270 | |
| 4 | 1952 | 257 | |
| 5 | 1962 | 248 | |
| 6 | 1962 | 243 | |
| 7 | 1963 | 239 | |
| 8 | 1963 | 210 | |
| 9 | 1951 | 187 | |
| 10 | 1964 | 179 | |
| 11 | 1960 | 176 | |
| 12 | 1967 | 140 | |
| 13 | 1965 | 126 | |
| 14 | 1969 | 120 | |
| 15 | 1966 | 109 | |
| 16 | 1965 | 99 | |
| 17 | 1963 | 81 | |
| 18 | 1956 | 78 | |
| 19 | 1971 | 76 | |
| 20 | 1964 | 71 |
About John J. Lander
John J. Lander is a scholar working on Surfaces, Coatings and Films, Atomic and Molecular Physics, and Optics, Automotive Engineering, Materials Chemistry and General Materials Science, having authored 56 papers that have together received 4.3k indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (17 papers), Electron and X-Ray Spectroscopy Techniques (11 papers), Surface Chemistry and Catalysis (7 papers), Advanced Battery Technologies Research (7 papers), ZnO doping and properties (6 papers), Advancements in Battery Materials (5 papers), Adsorption, diffusion, and thermodynamic properties of materials (5 papers) and Semiconductor materials and interfaces (5 papers). The work is most often cited by research in Surfaces, Coatings and Films (855 citations), Atomic and Molecular Physics, and Optics (1.8k citations), Materials Chemistry (1.1k citations), General Materials Science (37 citations) and Catalysis (64 citations). John J. Lander has collaborated with scholars based in United States. Frequent co-authors include John H. Morrison, John H. Morrison, D. G. Thomas, H. E. Kern, Garth W. Gobeli, Keanu Müller, James Christopher Phillips, Paul Delahay, A. U. MacRae and C.W. Tobias. Their work appears in journals such as Journal of The Electrochemical Society, Surface Science, Journal of Applied Physics, Journal of Physics and Chemistry of Solids and Journal of the American Chemical Society.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.