J.C. Vyas

1.2k citations
36 papers · 856 · h-index 14

Impact in

Papers in

J.C. Vyas

35 papers receiving 829 citations

Peers

J.C. Vyas
Comparison fields: 5 of 52
  • Metals and Alloys 85
  • Bioengineering 146
  • Polymers and Plastics 233
  • Materials Chemistry 432
  • Geophysics 93
Replace Kazuhiro S. Goto with:
Kazuhiro S. Goto Japan
Haixing Zheng United States
N. Afify Egypt
Diane Samélor France
D. Vouagner France
P. G. Fox United Kingdom
N. Zacchetti Italy
Yoshiaki Suda Japan
Е. А. Скрылева Russia
Taishi Matsushita Sweden
J.C. Vyas relative to Kazuhiro S. Goto Japan Kazuhiro S. Goto's profile →
Citations per field
00.5×10×14.2×
Kazuhiro S. Goto · 1×
Citations per year

Countries citing papers authored by J.C. Vyas

Since Specialization
Citations

This map shows the geographic impact of J.C. Vyas's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J.C. Vyas with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J.C. Vyas more than expected).

Fields of papers citing papers by J.C. Vyas

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J.C. Vyas. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J.C. Vyas. The network helps show where J.C. Vyas may publish in the future.

Co-authors

The 25 scholars most cited alongside J.C. Vyas, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J.C. Vyas Line = papers co-authored together J.C. Vyas links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 36 papers — load more, or switch the sort, to bring in the rest.

#Work
1 2009198
2 2003111
3 200888
4 199885
5 200242
6 200530
7 201729
8 201628
9 200825
10 200123
11 200722
12 201516
13 199316
14 201814
15 199912
16 200912
17 200410
18 199210
19 20089
20 20109

About J.C. Vyas

J.C. Vyas is a scholar working on Materials Chemistry, Electrical and Electronic Engineering, Geophysics, Polymers and Plastics and Civil and Structural Engineering, having authored 36 papers that have together received 856 indexed citations. Recurring topics across this work include earthquake and tectonic studies (7 papers), Seismic Waves and Analysis (7 papers), ZnO doping and properties (6 papers), Electronic and Structural Properties of Oxides (6 papers), Physics of Superconductivity and Magnetism (6 papers), Semiconductor materials and devices (5 papers), Seismic Performance and Analysis (5 papers) and Analytical Chemistry and Sensors (5 papers). The work is most often cited by research in Metals and Alloys (85 citations), Bioengineering (146 citations), Polymers and Plastics (233 citations), Materials Chemistry (432 citations) and Geophysics (93 citations). J.C. Vyas has collaborated with scholars based in India, Saudi Arabia and United States. Frequent co-authors include Nishad G. Deshpande, Y.G. Gudage, K.P. Muthe, Ramphal Sharma, YoungPak Lee, Ramphal Sharma, P. Martín, Ruspika Sundaresan, Ashis Kumar Satpati and Martin Gális. Their work appears in journals such as Bulletin of the Seismological Society of America, Journal of Crystal Growth, Physica C Superconductivity, Thin Solid Films and Applied Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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