J. O'Neill

744 citations
11 papers · 300 · h-index 6

Impact in

Papers in

J. O'Neill

10 papers receiving 269 citations

Peers

J. O'Neill
Comparison fields: 5 of 29
  • Signal Processing 69
  • Electrical and Electronic Engineering 246
  • Hardware and Architecture 29
  • Polymers and Plastics 33
  • Computer Vision and Pattern Recognition 37
Replace Jiyang Kang with:
Jiyang Kang China
R. Hagelauer Germany
H. Soeleman United States
Na Lv China
J.W. Fattaruso United States
Sunmean Kim South Korea
Xinpeng Xing China
Hongtao Zhang United States
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J. O'Neill relative to Jiyang Kang China Jiyang Kang's profile →
Citations per field
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Jiyang Kang · 1×
Citations per year

Countries citing papers authored by J. O'Neill

Since Specialization
Citations

This map shows the geographic impact of J. O'Neill's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. O'Neill with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. O'Neill more than expected).

Fields of papers citing papers by J. O'Neill

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. O'Neill. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. O'Neill. The network helps show where J. O'Neill may publish in the future.

Co-authors

The 23 scholars most cited alongside J. O'Neill, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. O'Neill Line = papers co-authored together J. O'Neill links everyone, so they are left out of the graph.

All Works

11 of 11 papers shown
#Work
1 2001139
2 199778
3 199336
4 200226
5 20036
6 19935
7 20024
8 20053
9 19862
10 19921
11 20030

About J. O'Neill

J. O'Neill is a scholar working on Electrical and Electronic Engineering, Hardware and Architecture, Computer Networks and Communications, Signal Processing and Computer Vision and Pattern Recognition, having authored 11 papers that have together received 300 indexed citations. Recurring topics across this work include Embedded Systems Design Techniques (3 papers), Interconnection Networks and Systems (3 papers), Photonic and Optical Devices (3 papers), Digital Filter Design and Implementation (2 papers), VLSI and Analog Circuit Testing (2 papers), Semiconductor Lasers and Optical Devices (2 papers), Advancements in PLL and VCO Technologies (2 papers) and Semiconductor materials and devices (2 papers). The work is most often cited by research in Signal Processing (69 citations), Electrical and Electronic Engineering (246 citations), Hardware and Architecture (29 citations), Polymers and Plastics (33 citations) and Computer Vision and Pattern Recognition (37 citations). J. O'Neill has collaborated with scholars based in United States, Germany and Switzerland. Frequent co-authors include Chris Nicol, P. Larsson, K. Azadet, Zhenan Bao, Y.-Y. Lin, Ananth Dodabalapur, Rahul Sarpeshkar, R. W. Filas, Howard E. Katz and B. K. Crone. Their work appears in journals such as IEEE Journal of Solid-State Circuits, Journal of Applied Physics, Signal Processing, Infoscience (Ecole Polytechnique Fédérale de Lausanne) and 2002 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.02CH37315).

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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