J. Flipse

779 citations
10 papers · 614 · h-index 10

Impact in

Papers in

J. Flipse

10 papers receiving 601 citations

Peers

J. Flipse
Comparison fields: 5 of 29
  • Atomic and Molecular Physics, and Optics 504
  • Condensed Matter Physics 183
  • Electronic, Optical and Magnetic Materials 118
  • Materials Chemistry 199
  • Electrical and Electronic Engineering 207
Replace A. Slachter with:
A. Slachter Netherlands
F. K. Dejene Netherlands
B. J. van Wees Netherlands
Ulrike Ritzmann Germany
Takafumi Akiho Japan
Moosa Hatami Netherlands
HuJun Jiao China
Tomosato Hioki Japan
M. V. Durnev Russia
Nadia Ligato Italy
J. Flipse relative to A. Slachter Netherlands A. Slachter's profile →
Citations per field
00.5×1.5×
A. Slachter · 1×
Citations per year

Countries citing papers authored by J. Flipse

Since Specialization
Citations

This map shows the geographic impact of J. Flipse's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by J. Flipse with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites J. Flipse more than expected).

Fields of papers citing papers by J. Flipse

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by J. Flipse. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by J. Flipse. The network helps show where J. Flipse may publish in the future.

Co-authors

The 23 scholars most cited alongside J. Flipse, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with J. Flipse Line = papers co-authored together J. Flipse links everyone, so they are left out of the graph.

All Works

10 of 10 papers shown
#Work
1 2012177
2 2014174
3 201262
4 201357
5 201446
6 201229
7 201522
8 201421
9 201216
10 201410

About J. Flipse

J. Flipse is a scholar working on Atomic and Molecular Physics, and Optics, Condensed Matter Physics, Electrical and Electronic Engineering, Materials Chemistry and Electronic, Optical and Magnetic Materials, having authored 10 papers that have together received 614 indexed citations. Recurring topics across this work include Magnetic properties of thin films (9 papers), Quantum and electron transport phenomena (8 papers), Surface and Thin Film Phenomena (3 papers), Physics of Superconductivity and Magnetism (2 papers), ZnO doping and properties (1 paper), Characterization and Applications of Magnetic Nanoparticles (1 paper), Theoretical and Computational Physics (1 paper) and Magneto-Optical Properties and Applications (1 paper). The work is most often cited by research in Atomic and Molecular Physics, and Optics (504 citations), Condensed Matter Physics (183 citations), Electronic, Optical and Magnetic Materials (118 citations), Materials Chemistry (199 citations) and Electrical and Electronic Engineering (207 citations). J. Flipse has collaborated with scholars based in Netherlands, Japan and Germany. Frequent co-authors include F. K. Dejene, B. J. van Wees, F. L. Bakker, G. Bauer, A. Slachter, B. J. van Wees, J. Ben Youssef, J. Shan, Markus Münzenberg and Andrii V. Chumak. Their work appears in journals such as Physical Review B, Physical Review Letters, Journal of Applied Physics, Journal of Physics D Applied Physics and Nature Nanotechnology.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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