I.J. Saunders

732 citations
18 papers · 518 · h-index 8

Impact in

Papers in

I.J. Saunders

17 papers receiving 477 citations

Peers

I.J. Saunders
Comparison fields: 5 of 54
  • Atomic and Molecular Physics, and Optics 212
  • Materials Chemistry 252
  • Electrical and Electronic Engineering 264
  • Instrumentation 13
  • Ceramics and Composites 18
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Citations per year

Countries citing papers authored by I.J. Saunders

Since Specialization
Citations

This map shows the geographic impact of I.J. Saunders's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by I.J. Saunders with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites I.J. Saunders more than expected).

Fields of papers citing papers by I.J. Saunders

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by I.J. Saunders. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by I.J. Saunders. The network helps show where I.J. Saunders may publish in the future.

Co-authors

The 21 scholars most cited alongside I.J. Saunders, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with I.J. Saunders Line = papers co-authored together I.J. Saunders links everyone, so they are left out of the graph.

All Works

18 of 18 papers shown
#Work
1 1979351
2 196953
3 196719
4 198016
5 200515
6 197515
7 20068
8 19908
9 20107
10 20106
11 20045
12 19685
13 20053
14 19833
15 19922
16 19731
17 19831
18
Nanometer Accuracy Non-contact Measurement of Free-form Optical Surfaces
20050

About I.J. Saunders

I.J. Saunders is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry, Computational Mechanics and Mechanical Engineering, having authored 18 papers that have together received 518 indexed citations. Recurring topics across this work include Semiconductor materials and devices (4 papers), Advanced Measurement and Metrology Techniques (3 papers), Semiconductor materials and interfaces (3 papers), Advanced Surface Polishing Techniques (3 papers), Electron and X-Ray Spectroscopy Techniques (2 papers), Adaptive optics and wavefront sensing (2 papers), Nuclear Physics and Applications (2 papers) and Surface Roughness and Optical Measurements (2 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (212 citations), Materials Chemistry (252 citations), Electrical and Electronic Engineering (264 citations), Instrumentation (13 citations) and Ceramics and Composites (18 citations). I.J. Saunders has collaborated with scholars based in United Kingdom, Netherlands and United States. Frequent co-authors include D. Sayah, B.K. Jones, A. Mzerd, Jeroen Heijmans, Will Saunders, Hedser van Brug, Jurek Brzeski, Michael Goodwin, Eli Atad‐Ettedgui and Tony Farrell. Their work appears in journals such as IEEE Electron Device Letters, Materials Chemistry and Physics, Journal of Physics D Applied Physics, Solid-State Electronics and Applied Physics Letters.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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