Greg Heuss
Impact in
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- Semiconductor materials and devices
- Advancements in Semiconductor Devices and Circuit Design
- Ferroelectric and Negative Capacitance Devices
- Integrated Circuits and Semiconductor Failure Analysis
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- Copper Interconnects and Reliability
Papers in
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- Semiconductor materials and devices 13
- Ferroelectric and Negative Capacitance Devices 1
- Integrated Circuits and Semiconductor Failure Analysis 1
- Molecular Junctions and Nanostructures 1
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- Semiconductor materials and interfaces 10
- Co-authors
- Veena Misra (13 shared papers)Huicai Zhong (7 shared papers)You-Seok Suh (10 shared papers)Choong-Ho Lee (1 shared paper)Jae Hoon Lee (2 shared papers)Dim‐Lee Kwong (1 shared paper)Dae-Gyu Park (1 shared paper)Gregory N. Parsons (1 shared paper)
- Journals
- Applied Physics Letters (3 papers)IEEE Electron Device Letters (2 papers)Journal of The Electrochemical Society (1 paper)Journal of Electronic Materials (1 paper)Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena (1 paper)
- Partner nations
- United StatesSouth Korea
In The Last Decade
Greg Heuss
12 papers receiving 291 citations
Peers
Comparison fields: 5 of 21
- Electrical and Electronic Engineering 297
- Electronic, Optical and Magnetic Materials 58
- Materials Chemistry 91
- Atomic and Molecular Physics, and Optics 60
- Mechanics of Materials 42
Countries citing papers authored by Greg Heuss
This map shows the geographic impact of Greg Heuss's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Greg Heuss with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Greg Heuss more than expected).
Fields of papers citing papers by Greg Heuss
This network shows the impact of papers produced by Greg Heuss. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Greg Heuss. The network helps show where Greg Heuss may publish in the future.
Co-authors
The 9 scholars most cited alongside Greg Heuss, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 2001 | 58 | |
| 2 | 2001 | 52 | |
| 3 | 2000 | 46 | |
| 4 | 2002 | 30 | |
| 5 | 2003 | 28 | |
| 6 | 2002 | 26 | |
| 7 | 2003 | 18 | |
| 8 | 2001 | 16 | |
| 9 | 2004 | 15 | |
| 10 | 2003 | 13 | |
| 11 | 2002 | 10 | |
| 12 | 2001 | 3 | |
| 13 | 2002 | 0 |
About Greg Heuss
Greg Heuss is a scholar working on Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Materials Chemistry and Polymers and Plastics, having authored 13 papers that have together received 315 indexed citations. Recurring topics across this work include Semiconductor materials and devices (13 papers), Semiconductor materials and interfaces (10 papers), Copper Interconnects and Reliability (4 papers), Silicon Nanostructures and Photoluminescence (3 papers), Ferroelectric and Negative Capacitance Devices (1 paper), Integrated Circuits and Semiconductor Failure Analysis (1 paper), Molecular Junctions and Nanostructures (1 paper) and Electronic and Structural Properties of Oxides (1 paper). The work is most often cited by research in Electrical and Electronic Engineering (297 citations), Electronic, Optical and Magnetic Materials (58 citations), Materials Chemistry (91 citations), Atomic and Molecular Physics, and Optics (60 citations) and Mechanics of Materials (42 citations). Greg Heuss has collaborated with scholars based in United States and South Korea. Frequent co-authors include Veena Misra, Huicai Zhong, You-Seok Suh, Choong-Ho Lee, Jae Hoon Lee, Dim‐Lee Kwong, Dae-Gyu Park, Gregory N. Parsons and Jaehoon Lee. Their work appears in journals such as Applied Physics Letters, IEEE Electron Device Letters, Journal of The Electrochemical Society, Journal of Electronic Materials and Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.