Fu-Min Yeh
Impact in
- Software top 5%
- Software Reliability and Analysis Research
-
- Reliability and Maintenance Optimization
Papers in
-
- VLSI and Analog Circuit Testing 4
- Embedded Systems Design Techniques 1
- Software 4
- Software Reliability and Analysis Research 3
- Journals
- IEEE Transactions on Reliability (3 papers)Electronics Letters (1 paper)VLSI design (1 paper)
- Partner nations
- Taiwan
In The Last Decade
Fu-Min Yeh
9 papers receiving 311 citations
Peers
Comparison fields: 5 of 36
- Software 154
- Safety, Risk, Reliability and Quality 173
- Statistics, Probability and Uncertainty 83
- Hardware and Architecture 42
- Computational Theory and Mathematics 77
Countries citing papers authored by Fu-Min Yeh
This map shows the geographic impact of Fu-Min Yeh's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fu-Min Yeh with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fu-Min Yeh more than expected).
Fields of papers citing papers by Fu-Min Yeh
This network shows the impact of papers produced by Fu-Min Yeh. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fu-Min Yeh. The network helps show where Fu-Min Yeh may publish in the future.
Co-authors
The 3 scholars most cited alongside Fu-Min Yeh, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 120 | |
| 2 | 2002 | 80 | |
| 3 | 2007 | 69 | |
| 4 | 2004 | 37 | |
| 5 | 2003 | 13 | |
| 6 | 1997 | 10 | |
| 7 | 2001 | 9 | |
| 8 | 2004 | 7 | |
| 9 | 2004 | 1 |
About Fu-Min Yeh
Fu-Min Yeh is a scholar working on Hardware and Architecture, Software, Safety, Risk, Reliability and Quality, Computational Theory and Mathematics and Electrical and Electronic Engineering, having authored 9 papers that have together received 346 indexed citations. Recurring topics across this work include Formal Methods in Verification (5 papers), Reliability and Maintenance Optimization (4 papers), VLSI and Analog Circuit Testing (4 papers), Software Reliability and Analysis Research (3 papers), Radiation Effects in Electronics (2 papers), Low-power high-performance VLSI design (2 papers), VLSI and FPGA Design Techniques (1 paper) and Embedded Systems Design Techniques (1 paper). The work is most often cited by research in Software (154 citations), Safety, Risk, Reliability and Quality (173 citations), Statistics, Probability and Uncertainty (83 citations), Hardware and Architecture (42 citations) and Computational Theory and Mathematics (77 citations). Fu-Min Yeh has collaborated with scholars based in Taiwan. Frequent co-authors include Sy‐Yen Kuo, Shyue-Kung Lu and Ing-Yi Chen. Their work appears in journals such as IEEE Transactions on Reliability, Electronics Letters and VLSI design.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.