Fu-Min Yeh
About
Fu-Min Yeh has authored 8 papers that have received a total of 213 indexed citations.
This includes 4 papers in Computational Theory and Mathematics, 4 papers in Hardware and Architecture and 4 papers in Safety, Risk, Reliability and Quality. The topics of these papers are Formal Methods in Verification (4 papers), Reliability and Maintenance Optimization (4 papers) and VLSI and Analog Circuit Testing (3 papers). Fu-Min Yeh is often cited by papers focused on Formal Methods in Verification (4 papers), Reliability and Maintenance Optimization (4 papers) and VLSI and Analog Circuit Testing (3 papers) and collaborates with scholars based in Taiwan. Fu-Min Yeh's co-authors include Sy‐Yen Kuo, Shyue-Kung Lu and Ing-Yi Chen and has published in prestigious journals such as Electronics Letters, IEEE Transactions on Reliability and VLSI design.
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