Fred Duewer
Impact in
- Structural Biology top 2%
- Advanced Electron Microscopy Techniques and Applications
- Radiation top 5%
- Advanced X-ray Imaging Techniques
- X-ray Spectroscopy and Fluorescence Analysis
Papers in
-
- Advanced X-ray Imaging Techniques 9
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- Near-Field Optical Microscopy 7
- Advanced X-ray and CT Imaging 7
- Co-authors
- X.‐D. Xiang (12 shared papers)Gao Chen (4 shared papers)Yalin Lu (4 shared papers)Michael Feser (9 shared papers)Tao Wei (3 shared papers)Wenbing Yun (8 shared papers)Hongtao Cui (5 shared papers)Andrei Tkachuk (5 shared papers)
- Journals
- Applied Physics Letters (6 papers)Applied Surface Science (1 paper)Journal of X-Ray Science and Technology (1 paper)Nature (1 paper)Zeitschrift für Kristallographie - Crystalline Materials (1 paper)
- Partner nations
- United StatesJapanTaiwan
In The Last Decade
Fred Duewer
28 papers receiving 977 citations
Peers
Comparison fields: 5 of 78
- Structural Biology 103
- Radiation 219
- Biomedical Engineering 505
- Surfaces, Coatings and Films 72
- Electrical and Electronic Engineering 450
Countries citing papers authored by Fred Duewer
This map shows the geographic impact of Fred Duewer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Fred Duewer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Fred Duewer more than expected).
Fields of papers citing papers by Fred Duewer
This network shows the impact of papers produced by Fred Duewer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Fred Duewer. The network helps show where Fred Duewer may publish in the future.
Co-authors
The 25 scholars most cited alongside Fred Duewer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 28 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1997 | 187 | |
| 2 | 2007 | 187 | |
| 3 | 1997 | 94 | |
| 4 | 2008 | 85 | |
| 5 | 2008 | 73 | |
| 6 | 2000 | 72 | |
| 7 | 2000 | 57 | |
| 8 | 1997 | 52 | |
| 9 | 1999 | 41 | |
| 10 | 2001 | 35 | |
| 11 | 1999 | 33 | |
| 12 | 1998 | 33 | |
| 13 | 2006 | 29 | |
| 14 | 2001 | 18 | |
| 15 | 2014 | 12 | |
| 16 | 2000 | 11 | |
| 17 | 2002 | 9 | |
| 18 | 2004 | 7 | |
| 19 | 2009 | 7 | |
| 20 | Non Destructive Failure Analysis Technique With a Laboratory Based 3D X-ray Nanotomography System | 2006 | 6 |
About Fred Duewer
Fred Duewer is a scholar working on Radiation, Biomedical Engineering, Structural Biology, Atomic and Molecular Physics, and Optics and Condensed Matter Physics, having authored 28 papers that have together received 1.1k indexed citations. Recurring topics across this work include Advanced X-ray Imaging Techniques (9 papers), Near-Field Optical Microscopy (7 papers), Advanced X-ray and CT Imaging (7 papers), Integrated Circuits and Semiconductor Failure Analysis (6 papers), Advanced Electron Microscopy Techniques and Applications (4 papers), Advanced Condensed Matter Physics (3 papers), Digital Radiography and Breast Imaging (3 papers) and Force Microscopy Techniques and Applications (3 papers). The work is most often cited by research in Structural Biology (103 citations), Radiation (219 citations), Biomedical Engineering (505 citations), Surfaces, Coatings and Films (72 citations) and Electrical and Electronic Engineering (450 citations). Fred Duewer has collaborated with scholars based in United States, Japan and Taiwan. Frequent co-authors include X.‐D. Xiang, Gao Chen, Yalin Lu, Michael Feser, Tao Wei, Wenbing Yun, Hongtao Cui, Andrei Tkachuk, Steve Wang and Hauyee Chang. Their work appears in journals such as Applied Physics Letters, Applied Surface Science, Journal of X-Ray Science and Technology, Nature and Zeitschrift für Kristallographie - Crystalline Materials.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.