F.J. Meyer
Impact in
- Hardware and Architecture top 2%
- VLSI and Analog Circuit Testing
- Embedded Systems Design Techniques
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- Distributed systems and fault tolerance
- Interconnection Networks and Systems
Papers in
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- VLSI and Analog Circuit Testing 42
- Embedded Systems Design Techniques 2
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- Interconnection Networks and Systems 6
- Co-authors
- Dhiraj K. Pradhan (5 shared papers)Fabrizio Lombardi (43 shared papers)Wei Kang Huang (8 shared papers)Xiaotao Chen (3 shared papers)H. Hashempour (4 shared papers)Jun Zhao (7 shared papers)Wei Liang Huang (1 shared paper)Nohpill Park (3 shared papers)
- Journals
- IEEE Transactions on Computers (6 papers)IEEE Transactions on Instrumentation and Measurement (5 papers)IEEE Transactions on Very Large Scale Integration (VLSI) Systems (3 papers)IEEE Transactions on Reliability (2 papers)IEEE Micro (1 paper)
- Partner nations
- United StatesChinaItaly
In The Last Decade
F.J. Meyer
49 papers receiving 575 citations
Peers
Comparison fields: 5 of 27
- Hardware and Architecture 325
- Computer Networks and Communications 204
- Electrical and Electronic Engineering 170
- Safety, Risk, Reliability and Quality 20
- Computational Theory and Mathematics 31
Countries citing papers authored by F.J. Meyer
This map shows the geographic impact of F.J. Meyer's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F.J. Meyer with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F.J. Meyer more than expected).
Fields of papers citing papers by F.J. Meyer
This network shows the impact of papers produced by F.J. Meyer. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F.J. Meyer. The network helps show where F.J. Meyer may publish in the future.
Co-authors
The 17 scholars most cited alongside F.J. Meyer, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 55 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1991 | 122 | |
| 2 | 1998 | 87 | |
| 3 | 1989 | 77 | |
| 4 | 1988 | 35 | |
| 5 | 2002 | 34 | |
| 6 | 2004 | 30 | |
| 7 | 1989 | 18 | |
| 8 | 2002 | 16 | |
| 9 | 2000 | 15 | |
| 10 | 2002 | 15 | |
| 11 | 2003 | 14 | |
| 12 | 2004 | 12 | |
| 13 | 2003 | 11 | |
| 14 | 2003 | 10 | |
| 15 | 2006 | 10 | |
| 16 | 2006 | 9 | |
| 17 | 2002 | 8 | |
| 18 | 2003 | 8 | |
| 19 | 2005 | 8 | |
| 20 | 2004 | 7 |
About F.J. Meyer
F.J. Meyer is a scholar working on Hardware and Architecture, Computer Networks and Communications, Electrical and Electronic Engineering, Computational Theory and Mathematics and Biomedical Engineering, having authored 55 papers that have together received 625 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (42 papers), Radiation Effects in Electronics (9 papers), Interconnection Networks and Systems (6 papers), Integrated Circuits and Semiconductor Failure Analysis (4 papers), VLSI and FPGA Design Techniques (3 papers), Advancements in PLL and VCO Technologies (3 papers), Electromagnetic Compatibility and Noise Suppression (2 papers) and Embedded Systems Design Techniques (2 papers). The work is most often cited by research in Hardware and Architecture (325 citations), Computer Networks and Communications (204 citations), Electrical and Electronic Engineering (170 citations), Safety, Risk, Reliability and Quality (20 citations) and Computational Theory and Mathematics (31 citations). F.J. Meyer has collaborated with scholars based in United States, China and Italy. Frequent co-authors include Dhiraj K. Pradhan, Fabrizio Lombardi, Wei Kang Huang, Xiaotao Chen, H. Hashempour, Jun Zhao, Wei Liang Huang, Nohpill Park, Minsu Choi and Marco Ottavi. Their work appears in journals such as IEEE Transactions on Computers, IEEE Transactions on Instrumentation and Measurement, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Reliability and IEEE Micro.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.