F. Overney
Impact in
- Automotive Engineering top 1%
- Advanced Battery Technologies Research
-
- Advanced Electrical Measurement Techniques
- Advancements in Battery Materials
- Advanced Battery Materials and Technologies
Papers in
-
- Advanced Electrical Measurement Techniques 63
- Semiconductor materials and devices 2
- Silicon Carbide Semiconductor Technologies 2
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- Scientific Measurement and Uncertainty Evaluation 10
- Co-authors
- B. Jeanneret (43 shared papers)Nina Meddings (1 shared paper)Jong‐Sook Lee (1 shared paper)Emilio Napolitano (1 shared paper)Marco Heinrich (1 shared paper)Steffen Seitz (1 shared paper)Juyeon Park (1 shared paper)Rinaldo Raccichini (1 shared paper)
- Journals
- IEEE Transactions on Instrumentation and Measurement (22 papers)Metrologia (13 papers)Measurement Science and Technology (2 papers)Journal of Crystal Growth (1 paper)physica status solidi (RRL) - Rapid Research Letters (1 paper)
- Partner nations
- SwitzerlandGermanyUnited States
In The Last Decade
F. Overney
73 papers receiving 1.5k citations
F. Overney's Hit Papers
Peers
Comparison fields: 5 of 41
- Automotive Engineering 407
- Electrical and Electronic Engineering 1k
- Statistics, Probability and Uncertainty 114
- Electrochemistry 20
- Atomic and Molecular Physics, and Optics 115
Countries citing papers authored by F. Overney
This map shows the geographic impact of F. Overney's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. Overney with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. Overney more than expected).
Fields of papers citing papers by F. Overney
This network shows the impact of papers produced by F. Overney. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. Overney. The network helps show where F. Overney may publish in the future.
Co-authors
The 25 scholars most cited alongside F. Overney, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 77 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | Application of electrochemical impedance spectroscopy to commercial Li-ion cells: A review Hit paper breakdown → | 2020 | 700 |
| 2 | 2011 | 60 | |
| 3 | 2016 | 54 | |
| 4 | 2011 | 51 | |
| 5 | 1995 | 46 | |
| 6 | 2018 | 42 | |
| 7 | 2008 | 40 | |
| 8 | 2006 | 31 | |
| 9 | 2020 | 30 | |
| 10 | 2017 | 28 | |
| 11 | 2018 | 28 | |
| 12 | 2011 | 27 | |
| 13 | 2011 | 27 | |
| 14 | 2016 | 27 | |
| 15 | 2009 | 26 | |
| 16 | 2001 | 25 | |
| 17 | 2014 | 23 | |
| 18 | 2013 | 21 | |
| 19 | 2006 | 20 | |
| 20 | 2003 | 19 |
About F. Overney
F. Overney is a scholar working on Electrical and Electronic Engineering, Statistics, Probability and Uncertainty, Atomic and Molecular Physics, and Optics, Materials Chemistry and Automotive Engineering, having authored 77 papers that have together received 1.6k indexed citations. Recurring topics across this work include Advanced Electrical Measurement Techniques (63 papers), Quantum and electron transport phenomena (11 papers), Scientific Measurement and Uncertainty Evaluation (10 papers), Graphene research and applications (6 papers), Advanced Frequency and Time Standards (3 papers), Semiconductor materials and devices (2 papers), Silicon Carbide Semiconductor Technologies (2 papers) and Semiconductor materials and interfaces (2 papers). The work is most often cited by research in Automotive Engineering (407 citations), Electrical and Electronic Engineering (1k citations), Statistics, Probability and Uncertainty (114 citations), Electrochemistry (20 citations) and Atomic and Molecular Physics, and Optics (115 citations). F. Overney has collaborated with scholars based in Switzerland, Germany and United States. Frequent co-authors include B. Jeanneret, Nina Meddings, Jong‐Sook Lee, Emilio Napolitano, Marco Heinrich, Steffen Seitz, Juyeon Park, Rinaldo Raccichini, Miran Gaberšček and V. Ruiz. Their work appears in journals such as IEEE Transactions on Instrumentation and Measurement, Metrologia, Measurement Science and Technology, Journal of Crystal Growth and physica status solidi (RRL) - Rapid Research Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.