F. C. Ho

27 papers receiving 634 citations

Peers

F. C. Ho
Comparison fields: 5 of 57
  • Surfaces, Coatings and Films 159
  • Computational Mechanics 182
  • Electrical and Electronic Engineering 400
  • Polymers and Plastics 96
  • Materials Chemistry 275
Replace Elmar Ritter with:
Elmar Ritter Liechtenstein
Steffen Wilbrandt Germany
Iris Bloomer United States
John L. Vossen United States
A. Waldorf Canada
B. Harbecke Germany
Narumi Inoue Japan
A. Cachard France
W.T. Pawlewicz United States
J. M. Eldridge United States
F. C. Ho relative to Elmar Ritter Liechtenstein Elmar Ritter's profile →
Citations per field
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Elmar Ritter · 1×
Citations per year

Countries citing papers authored by F. C. Ho

Since Specialization
Citations

This map shows the geographic impact of F. C. Ho's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by F. C. Ho with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites F. C. Ho more than expected).

Fields of papers citing papers by F. C. Ho

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by F. C. Ho. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by F. C. Ho. The network helps show where F. C. Ho may publish in the future.

Co-authors

The 25 scholars most cited alongside F. C. Ho, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with F. C. Ho Line = papers co-authored together F. C. Ho links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 30 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1984190
2 1983161
3 200056
4 198742
5 198939
6 198933
7 198230
8 199623
9 199319
10 200213
11 200212
12 200210
13 20229
14 19858
15 19997
16 19867
17 20014
18 19934
19
Determination of optical constants of thin-film-coating materials based on inverse synthesis (A)
19822
20 20062

About F. C. Ho

F. C. Ho is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Surfaces, Coatings and Films, Computational Mechanics and Biomedical Engineering, having authored 30 papers that have together received 679 indexed citations. Recurring topics across this work include Optical Coatings and Gratings (8 papers), Surface Roughness and Optical Measurements (7 papers), ZnO doping and properties (5 papers), Transition Metal Oxide Nanomaterials (4 papers), Advanced optical system design (4 papers), Thin-Film Transistor Technologies (4 papers), Gas Sensing Nanomaterials and Sensors (4 papers) and Color Science and Applications (3 papers). The work is most often cited by research in Surfaces, Coatings and Films (159 citations), Computational Mechanics (182 citations), Electrical and Electronic Engineering (400 citations), Polymers and Plastics (96 citations) and Materials Chemistry (275 citations). F. C. Ho has collaborated with scholars based in Taiwan, Canada and China. Frequent co-authors include J. A. Dobrowolski, A. Waldorf, Jyh‐Jier Ho, R. M. A. Azzam, William E. Case, Martin Purvis, Jean M. Bennett, C. K. Carniglia, Ursula J. Gibson and P. A. Temple. Their work appears in journals such as Journal of Electronic Materials, Journal of Materials Science Materials in Electronics, Journal of the Optical Society of America A, Japanese Journal of Applied Physics and AAPG Bulletin.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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