Eric M. Pearson
Impact in
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- Advanced Physical and Chemical Molecular Interactions
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- Statistical Mechanics and Entropy
- Advanced Thermodynamics and Statistical Mechanics
Papers in
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- Surface and Thin Film Phenomena 8
- Semiconductor materials and interfaces 1
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- Advanced Physical and Chemical Molecular Interactions 1
- Co-authors
- T. Halicioǧlu (9 shared papers)William A. Tiller (9 shared papers)T. Takai (1 shared paper)
- Journals
- Surface Science (3 papers)Journal of Crystal Growth (3 papers)Journal of Vacuum Science & Technology A Vacuum Surfaces and Films (1 paper)Physical Review A (1 paper)Surface Science Letters (1 paper)
- Partner nations
- United States
In The Last Decade
Eric M. Pearson
8 papers receiving 408 citations
Peers
Comparison fields: 5 of 26
- Physical and Theoretical Chemistry 118
- Statistical and Nonlinear Physics 64
- Atomic and Molecular Physics, and Optics 137
- Atmospheric Science 50
- Materials Chemistry 147
Countries citing papers authored by Eric M. Pearson
This map shows the geographic impact of Eric M. Pearson's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Eric M. Pearson with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Eric M. Pearson more than expected).
Fields of papers citing papers by Eric M. Pearson
This network shows the impact of papers produced by Eric M. Pearson. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Eric M. Pearson. The network helps show where Eric M. Pearson may publish in the future.
Co-authors
The 3 scholars most cited alongside Eric M. Pearson, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1984 | 195 | |
| 2 | 1985 | 176 | |
| 3 | 1987 | 20 | |
| 4 | 1986 | 12 | |
| 5 | Si(111)表面の再構成に対する表面応力の効果 | 1986 | 8 |
| 6 | 1987 | 6 | |
| 7 | 1987 | 3 | |
| 8 | 1987 | 2 | |
| 9 | 1986 | 0 |
About Eric M. Pearson
Eric M. Pearson is a scholar working on Atomic and Molecular Physics, and Optics, Physical and Theoretical Chemistry, Statistical and Nonlinear Physics, Materials Chemistry and Electrical and Electronic Engineering, having authored 9 papers that have together received 422 indexed citations. Recurring topics across this work include Surface and Thin Film Phenomena (8 papers), Solidification and crystal growth phenomena (1 paper), Statistical Mechanics and Entropy (1 paper), Advanced Physical and Chemical Molecular Interactions (1 paper), Silicon Carbide Semiconductor Technologies (1 paper), Advanced Thermodynamics and Statistical Mechanics (1 paper) and Semiconductor materials and interfaces (1 paper). The work is most often cited by research in Physical and Theoretical Chemistry (118 citations), Statistical and Nonlinear Physics (64 citations), Atomic and Molecular Physics, and Optics (137 citations), Atmospheric Science (50 citations) and Materials Chemistry (147 citations). Eric M. Pearson has collaborated with scholars based in United States. Frequent co-authors include T. Halicioǧlu, William A. Tiller and T. Takai. Their work appears in journals such as Surface Science, Journal of Crystal Growth, Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Physical Review A and Surface Science Letters.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.