E.D. Boyes

29 papers receiving 544 citations

Peers

E.D. Boyes
Comparison fields: 5 of 56
  • Metals and Alloys 76
  • Structural Biology 27
  • Condensed Matter Physics 203
  • Electronic, Optical and Magnetic Materials 160
  • Surfaces, Coatings and Films 57
Replace D. Bhogeswara Rao with:
D. Bhogeswara Rao United States
Toshiaki Ōsaka Japan
M.S. Rogalski Portugal
Huei-Jyun Shih United States
B. E. Sundquist United States
I Martin France
B.J. Kestel United States
G. Grange France
R. Spal United States
M. Perdereau France
E.D. Boyes relative to D. Bhogeswara Rao United States D. Bhogeswara Rao's profile →
Citations per field
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D. Bhogeswara Rao · 1×
Citations per year

Countries citing papers authored by E.D. Boyes

Since Specialization
Citations

This map shows the geographic impact of E.D. Boyes's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E.D. Boyes with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E.D. Boyes more than expected).

Fields of papers citing papers by E.D. Boyes

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by E.D. Boyes. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E.D. Boyes. The network helps show where E.D. Boyes may publish in the future.

Co-authors

The 25 scholars most cited alongside E.D. Boyes, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with E.D. Boyes Line = papers co-authored together E.D. Boyes links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 31 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1989192
2 1976146
3 201347
4 197530
5 197526
6 200025
7 197215
8 198914
9
Low Voltage Scanning Electron Microscopy
198810
10 19919
11 19727
12 19906
13 20005
14 19765
15 20015
16 19725
17 19924
18 20043
19 20033
20 19843

About E.D. Boyes

E.D. Boyes is a scholar working on Surfaces, Coatings and Films, Biomedical Engineering, Atomic and Molecular Physics, and Optics, Materials Chemistry and Electrical and Electronic Engineering, having authored 31 papers that have together received 574 indexed citations. Recurring topics across this work include Electron and X-Ray Spectroscopy Techniques (16 papers), Advanced Materials Characterization Techniques (12 papers), Force Microscopy Techniques and Applications (5 papers), Surface and Thin Film Phenomena (5 papers), Advanced Electron Microscopy Techniques and Applications (3 papers), Ion-surface interactions and analysis (3 papers), Diamond and Carbon-based Materials Research (3 papers) and Advancements in Photolithography Techniques (2 papers). The work is most often cited by research in Metals and Alloys (76 citations), Structural Biology (27 citations), Condensed Matter Physics (203 citations), Electronic, Optical and Magnetic Materials (160 citations) and Surfaces, Coatings and Films (57 citations). E.D. Boyes has collaborated with scholars based in United States and United Kingdom. Frequent co-authors include M.J. Southon, A.R. Waugh, M.A. Subramanian, Pratibha L. Gai, J. Gopalakrishnan, A.W. Sleight, C.C. Torardi, W. E. Farneth, T.R. Askew and R. B. Flippen. Their work appears in journals such as Microscopy and Microanalysis, Physica C Superconductivity, Surface Science, Journal of Microscopy and Chemistry of Materials.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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