E. Kaneko
Impact in
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- Vacuum and Plasma Arcs
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- Electrical Fault Detection and Protection
- Electrostatic Discharge in Electronics
Papers in
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- Vacuum and Plasma Arcs 28
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- Electrical Fault Detection and Protection 14
- Power Transformer Diagnostics and Insulation 4
- Co-authors
- S. Yanabu (13 shared papers)Toru Tamagawa (5 shared papers)I. Ohshima (11 shared papers)M. Homma (7 shared papers)T. Shioiri (9 shared papers)R.P.P. Smeets (3 shared papers)K. Yokokura (4 shared papers)H. Takahashi (1 shared paper)
- Journals
- IEEE Transactions on Power Delivery (7 papers)IEEE Transactions on Plasma Science (4 papers)IEEE Transactions on Dielectrics and Electrical Insulation (4 papers)IEICE Transactions on Electronics (1 paper)Proceedings of the IEEE (1 paper)
- Partner nations
- JapanNetherlandsUnited States
In The Last Decade
E. Kaneko
32 papers receiving 466 citations
Peers
Comparison fields: 5 of 38
- Atomic and Molecular Physics, and Optics 413
- Electrical and Electronic Engineering 372
- Nuclear Energy and Engineering 2
- Materials Chemistry 148
- Mechanical Engineering 103
Countries citing papers authored by E. Kaneko
This map shows the geographic impact of E. Kaneko's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by E. Kaneko with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites E. Kaneko more than expected).
Fields of papers citing papers by E. Kaneko
This network shows the impact of papers produced by E. Kaneko. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by E. Kaneko. The network helps show where E. Kaneko may publish in the future.
Co-authors
The 25 scholars most cited alongside E. Kaneko, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 35 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1985 | 60 | |
| 2 | 1986 | 60 | |
| 3 | 1983 | 38 | |
| 4 | 1993 | 34 | |
| 5 | 1995 | 32 | |
| 6 | 2003 | 29 | |
| 7 | 1995 | 21 | |
| 8 | 1992 | 21 | |
| 9 | 1981 | 20 | |
| 10 | 1987 | 19 | |
| 11 | 1987 | 18 | |
| 12 | 2006 | 17 | |
| 13 | 1999 | 16 | |
| 14 | 1985 | 15 | |
| 15 | 2002 | 15 | |
| 16 | 1995 | 14 | |
| 17 | 2002 | 12 | |
| 18 | 1997 | 11 | |
| 19 | 2002 | 10 | |
| 20 | 1995 | 8 |
About E. Kaneko
E. Kaneko is a scholar working on Atomic and Molecular Physics, and Optics, Electrical and Electronic Engineering, Materials Chemistry, Mechanical Engineering and Control and Systems Engineering, having authored 35 papers that have together received 502 indexed citations. Recurring topics across this work include Vacuum and Plasma Arcs (28 papers), Electrical Fault Detection and Protection (14 papers), High voltage insulation and dielectric phenomena (11 papers), Advanced Sensor Technologies Research (5 papers), Thermal Analysis in Power Transmission (5 papers), Power Transformer Diagnostics and Insulation (4 papers), Advanced materials and composites (4 papers) and Electrical Contact Performance and Analysis (3 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (413 citations), Electrical and Electronic Engineering (372 citations), Nuclear Energy and Engineering (2 citations), Materials Chemistry (148 citations) and Mechanical Engineering (103 citations). E. Kaneko has collaborated with scholars based in Japan, Netherlands and United States. Frequent co-authors include S. Yanabu, Toru Tamagawa, I. Ohshima, M. Homma, T. Shioiri, R.P.P. Smeets, K. Yokokura, H. Takahashi, H. Ikeda and Yoshikazu Hoshina. Their work appears in journals such as IEEE Transactions on Power Delivery, IEEE Transactions on Plasma Science, IEEE Transactions on Dielectrics and Electrical Insulation, IEICE Transactions on Electronics and Proceedings of the IEEE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.