Detlef Eich
Impact in
-
- Chalcogenide Semiconductor Thin Films
- Advanced Semiconductor Detectors and Materials
- Instrumentation top 10%
Papers in
-
- Infrared Target Detection Methodologies 31
- Calibration and Measurement Techniques 13
-
- Advanced Semiconductor Detectors and Materials 48
- Chalcogenide Semiconductor Thin Films 17
- CCD and CMOS Imaging Sensors 8
- Co-authors
- Eberhard Umbach (14 shared papers)R. Fink (14 shared papers)Heinrich Figgemeier (39 shared papers)Stefan Hanna (31 shared papers)Ulf Winkler (3 shared papers)S. K. Kulkarni (2 shared papers)Rainer Breiter (21 shared papers)J. Wendler (14 shared papers)
- Journals
- Journal of Electronic Materials (11 papers)Applied Physics Letters (3 papers)Thin Solid Films (2 papers)physica status solidi (a) (2 papers)IEEE Journal of Selected Topics in Quantum Electronics (2 papers)
- Partner nations
- GermanyItalyUnited States
In The Last Decade
Detlef Eich
56 papers receiving 674 citations
Peers
Comparison fields: 5 of 42
- Electrical and Electronic Engineering 671
- Instrumentation 40
- Materials Chemistry 385
- Atomic and Molecular Physics, and Optics 237
- Aerospace Engineering 161
Countries citing papers authored by Detlef Eich
This map shows the geographic impact of Detlef Eich's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Detlef Eich with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Detlef Eich more than expected).
Fields of papers citing papers by Detlef Eich
This network shows the impact of papers produced by Detlef Eich. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Detlef Eich. The network helps show where Detlef Eich may publish in the future.
Co-authors
The 25 scholars most cited alongside Detlef Eich, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 62 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 121 | |
| 2 | 1999 | 91 | |
| 3 | 2005 | 41 | |
| 4 | 2000 | 38 | |
| 5 | 1999 | 31 | |
| 6 | 1999 | 30 | |
| 7 | 2017 | 27 | |
| 8 | 2006 | 25 | |
| 9 | 1999 | 23 | |
| 10 | 2016 | 18 | |
| 11 | 2018 | 18 | |
| 12 | 2012 | 15 | |
| 13 | 2014 | 15 | |
| 14 | 2016 | 14 | |
| 15 | 2019 | 13 | |
| 16 | 2018 | 13 | |
| 17 | 1998 | 13 | |
| 18 | 2000 | 12 | |
| 19 | 2000 | 11 | |
| 20 | 2016 | 11 |
About Detlef Eich
Detlef Eich is a scholar working on Aerospace Engineering, Electrical and Electronic Engineering, Atomic and Molecular Physics, and Optics, Instrumentation and Materials Chemistry, having authored 62 papers that have together received 777 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (48 papers), Infrared Target Detection Methodologies (31 papers), Chalcogenide Semiconductor Thin Films (17 papers), Calibration and Measurement Techniques (13 papers), Semiconductor Quantum Structures and Devices (12 papers), Quantum Dots Synthesis And Properties (9 papers), CCD and CMOS Imaging Sensors (8 papers) and Advanced Optical Sensing Technologies (5 papers). The work is most often cited by research in Electrical and Electronic Engineering (671 citations), Instrumentation (40 citations), Materials Chemistry (385 citations), Atomic and Molecular Physics, and Optics (237 citations) and Aerospace Engineering (161 citations). Detlef Eich has collaborated with scholars based in Germany, Italy and United States. Frequent co-authors include Eberhard Umbach, R. Fink, Heinrich Figgemeier, Stefan Hanna, Ulf Winkler, S. K. Kulkarni, Rainer Breiter, J. Wendler, Clemens Heske and Walter Riedl. Their work appears in journals such as Journal of Electronic Materials, Applied Physics Letters, Thin Solid Films, physica status solidi (a) and IEEE Journal of Selected Topics in Quantum Electronics.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.