Dawei Tu

649 citations
78 papers · 504 · h-index 13

Impact in

Papers in

Dawei Tu

71 papers receiving 474 citations

Peers

Dawei Tu
Comparison fields: 5 of 57
  • Computer Vision and Pattern Recognition 333
  • Media Technology 89
  • Geology 54
  • Instrumentation 25
  • Industrial and Manufacturing Engineering 55
Replace Carlos Ricolfe-Viala with:
Carlos Ricolfe-Viala Spain
Shourui Yang China
Yunpeng Ma China
Zhilong Su China
Xiaoli Hao China
Ziji Ma China
Rudi Penne Belgium
Fengshui Jing China
Pramook Khungurn United States
Dawei Tu relative to Carlos Ricolfe-Viala Spain Carlos Ricolfe-Viala's profile →
Citations per field
00.5×2×3×4×4.8×
Carlos Ricolfe-Viala · 1×
Citations per year

Countries citing papers authored by Dawei Tu

Since Specialization
Citations

This map shows the geographic impact of Dawei Tu's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Dawei Tu with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Dawei Tu more than expected).

Fields of papers citing papers by Dawei Tu

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Dawei Tu. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Dawei Tu. The network helps show where Dawei Tu may publish in the future.

Co-authors

The 25 scholars most cited alongside Dawei Tu, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Dawei Tu Line = papers co-authored together Dawei Tu links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 78 papers — load more, or switch the sort, to bring in the rest.

#Work
1 201247
2 201833
3 201532
4 201431
5 201827
6 202126
7 201322
8 202019
9 202216
10 201415
11 202215
12 201414
13 202114
14 201912
15 201811
16 20239
17 20239
18 20189
19 20238
20 20227

About Dawei Tu

Dawei Tu is a scholar working on Computer Vision and Pattern Recognition, Media Technology, Aerospace Engineering, Electrical and Electronic Engineering and Mechanical Engineering, having authored 78 papers that have together received 504 indexed citations. Recurring topics across this work include Optical measurement and interference techniques (27 papers), Image Enhancement Techniques (14 papers), Advanced Vision and Imaging (14 papers), Image Processing Techniques and Applications (12 papers), Robotics and Sensor-Based Localization (10 papers), Gaze Tracking and Assistive Technology (9 papers), Optical Systems and Laser Technology (7 papers) and Advanced Measurement and Metrology Techniques (6 papers). The work is most often cited by research in Computer Vision and Pattern Recognition (333 citations), Media Technology (89 citations), Geology (54 citations), Instrumentation (25 citations) and Industrial and Manufacturing Engineering (55 citations). Dawei Tu has collaborated with scholars based in China, Hong Kong and Singapore. Frequent co-authors include Qijie Zhao, Youfu Li, Li Chen, Peng Cao, Qi Zhu, Xu Zhang, Xu Zhang, Mei Wang, Jianxia Lü and Qingqing Zhang. Their work appears in journals such as Optical Engineering, Measurement Science and Technology, Measurement, Optics Express and Optics and Lasers in Engineering.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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