Davide Appello

622 citations
63 papers · 462 · h-index 13

Impact in

Papers in

    • VLSI and Analog Circuit Testing 51
    • Embedded Systems Design Techniques 2
    • Physical Unclonable Functions (PUFs) and Hardware Security 2
    • Real-Time Systems Scheduling 2
    • Radiation Effects in Electronics 9
    • Integrated Circuits and Semiconductor Failure Analysis 7

Davide Appello

60 papers receiving 427 citations

Peers

Davide Appello
Comparison fields: 5 of 23
  • Hardware and Architecture 389
  • Software 21
  • Industrial and Manufacturing Engineering 21
  • Electrical and Electronic Engineering 114
  • Control and Systems Engineering 28
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Citations per year

Countries citing papers authored by Davide Appello

Since Specialization
Citations

This map shows the geographic impact of Davide Appello's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Davide Appello with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Davide Appello more than expected).

Fields of papers citing papers by Davide Appello

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by Davide Appello. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Davide Appello. The network helps show where Davide Appello may publish in the future.

Co-authors

The 25 scholars most cited alongside Davide Appello, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with Davide Appello Line = papers co-authored together Davide Appello links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 63 papers — load more, or switch the sort, to bring in the rest.

#Work
1 200333
2 200433
3 202125
4 200623
5 200422
6 200617
7 201017
8 201717
9
Adapting to adaptive testing
201016
10 200615
11 200414
12 200113
13 201913
14 201811
15 200910
16 20049
17 20119
18 20209
19 20219
20 20229

About Davide Appello

Davide Appello is a scholar working on Hardware and Architecture, Electrical and Electronic Engineering, Software, Industrial and Manufacturing Engineering and Emergency Medical Services, having authored 63 papers that have together received 462 indexed citations. Recurring topics across this work include VLSI and Analog Circuit Testing (51 papers), Radiation Effects in Electronics (9 papers), Integrated Circuits and Semiconductor Failure Analysis (7 papers), Software Testing and Debugging Techniques (3 papers), Digital Transformation in Industry (2 papers), Embedded Systems Design Techniques (2 papers), Physical Unclonable Functions (PUFs) and Hardware Security (2 papers) and Real-Time Systems Scheduling (2 papers). The work is most often cited by research in Hardware and Architecture (389 citations), Software (21 citations), Industrial and Manufacturing Engineering (21 citations), Electrical and Electronic Engineering (114 citations) and Control and Systems Engineering (28 citations). Davide Appello has collaborated with scholars based in Italy, United States and France. Frequent co-authors include Paolo Bernardi, Matteo Sonza Reorda, Michelangelo Grosso, Maurizio Rebaudengo, Stephen Sunter, Aubin Roy, Emil Gizdarski, Massimo Violante, Ernesto Sánchez and Kenneth M. Butler. Their work appears in journals such as IEEE Access, IEEE Transactions on Computers, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, IEEE Transactions on Nuclear Science and IEEE Design and Test.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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