Daniel V. McCaughan
Impact in
- Computational Mechanics top 5%
- Ion-surface interactions and analysis
-
- Glass properties and applications
Papers in
-
- Semiconductor materials and devices 17
- Integrated Circuits and Semiconductor Failure Analysis 8
- Advancements in Semiconductor Devices and Circuit Design 3
-
- Ion-surface interactions and analysis 10
- Co-authors
- R.A. Kushner (8 shared papers)C. W. White (3 shared papers)D.L. Simms (3 shared papers)N. H. Tolk (1 shared paper)B. C. Wonsiewicz (2 shared papers)Ronald L. Meek (1 shared paper)H. C. Webber (1 shared paper)J Geddes (2 shared papers)
- Journals
- Journal of Applied Physics (7 papers)Electronics Letters (3 papers)Applied Physics Letters (2 papers)Journal of The Electrochemical Society (2 papers)Proceedings of the IEEE (2 papers)
- Partner nations
- United KingdomUnited StatesIndia
In The Last Decade
Daniel V. McCaughan
26 papers receiving 338 citations
Peers
Comparison fields: 5 of 41
- Computational Mechanics 185
- Ceramics and Composites 37
- Surfaces, Coatings and Films 38
- Electrical and Electronic Engineering 254
- Radiation 35
Countries citing papers authored by Daniel V. McCaughan
This map shows the geographic impact of Daniel V. McCaughan's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by Daniel V. McCaughan with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites Daniel V. McCaughan more than expected).
Fields of papers citing papers by Daniel V. McCaughan
This network shows the impact of papers produced by Daniel V. McCaughan. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by Daniel V. McCaughan. The network helps show where Daniel V. McCaughan may publish in the future.
Co-authors
The 16 scholars most cited alongside Daniel V. McCaughan, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 27 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1973 | 91 | |
| 2 | 1975 | 57 | |
| 3 | 1974 | 40 | |
| 4 | 1973 | 27 | |
| 5 | 1972 | 27 | |
| 6 | 1974 | 17 | |
| 7 | 1974 | 14 | |
| 8 | 1974 | 13 | |
| 9 | 1973 | 11 | |
| 10 | 1973 | 10 | |
| 11 | 1976 | 10 | |
| 12 | 1979 | 9 | |
| 13 | 1980 | 8 | |
| 14 | 1981 | 6 | |
| 15 | 1975 | 5 | |
| 16 | 1974 | 5 | |
| 17 | 1973 | 4 | |
| 18 | 1973 | 4 | |
| 19 | 1976 | 4 | |
| 20 | 1980 | 3 |
About Daniel V. McCaughan
Daniel V. McCaughan is a scholar working on Electrical and Electronic Engineering, Computational Mechanics, Atomic and Molecular Physics, and Optics, Biomedical Engineering and Materials Chemistry, having authored 27 papers that have together received 377 indexed citations. Recurring topics across this work include Semiconductor materials and devices (17 papers), Ion-surface interactions and analysis (10 papers), Integrated Circuits and Semiconductor Failure Analysis (8 papers), Semiconductor materials and interfaces (7 papers), Advancements in Semiconductor Devices and Circuit Design (3 papers), Metal and Thin Film Mechanics (2 papers), Non-Invasive Vital Sign Monitoring (2 papers) and Advanced Optical Sensing Technologies (2 papers). The work is most often cited by research in Computational Mechanics (185 citations), Ceramics and Composites (37 citations), Surfaces, Coatings and Films (38 citations), Electrical and Electronic Engineering (254 citations) and Radiation (35 citations). Daniel V. McCaughan has collaborated with scholars based in United Kingdom, United States and India. Frequent co-authors include R.A. Kushner, C. W. White, D.L. Simms, N. H. Tolk, B. C. Wonsiewicz, Ronald L. Meek, H. C. Webber, J Geddes, Eoin W. Gray and R.H. Walden. Their work appears in journals such as Journal of Applied Physics, Electronics Letters, Applied Physics Letters, Journal of The Electrochemical Society and Proceedings of the IEEE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.