C.Y. Nian
Impact in
- Mechanical Engineering top 10%
- Advanced machining processes and optimization
- Advanced Measurement and Metrology Techniques
-
- Manufacturing Process and Optimization
- Engineering Technology and Methodologies
Papers in
-
- Advanced machining processes and optimization 5
- Advanced Measurement and Metrology Techniques 3
-
- Iterative Learning Control Systems 3
- Industrial Technology and Control Systems 2
- Co-authors
- Y.S. Tarng (10 shared papers)Weihong Yang (1 shared paper)Chih-Chang Lin (1 shared paper)J. Y. Kao (1 shared paper)Chung-Wei Chen (2 shared papers)Hsiu‐Ming Wu (2 shared papers)Hendro Nurhadi (1 shared paper)
In The Last Decade
C.Y. Nian
12 papers receiving 326 citations
Peers
Comparison fields: 5 of 60
- Mechanical Engineering 251
- Industrial and Manufacturing Engineering 59
- Biomedical Engineering 134
- Electrical and Electronic Engineering 142
- Control and Systems Engineering 53
Countries citing papers authored by C.Y. Nian
This map shows the geographic impact of C.Y. Nian's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C.Y. Nian with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C.Y. Nian more than expected).
Fields of papers citing papers by C.Y. Nian
This network shows the impact of papers produced by C.Y. Nian. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C.Y. Nian. The network helps show where C.Y. Nian may publish in the future.
Co-authors
The 7 scholars most cited alongside C.Y. Nian, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
| # | Work | ||
|---|---|---|---|
| 1 | 1999 | 200 | |
| 2 | 2001 | 74 | |
| 3 | 2007 | 28 | |
| 4 | 2005 | 14 | |
| 5 | 1995 | 14 | |
| 6 | 1996 | 12 | |
| 7 | 2005 | 5 | |
| 8 | 1997 | 5 | |
| 9 | 2002 | 3 | |
| 10 | 2025 | 2 | |
| 11 | 2025 | 1 | |
| 12 | 2010 | 1 |
About C.Y. Nian
C.Y. Nian is a scholar working on Mechanical Engineering, Control and Systems Engineering, Artificial Intelligence, Computer Vision and Pattern Recognition and Media Technology, having authored 12 papers that have together received 359 indexed citations. Recurring topics across this work include Advanced machining processes and optimization (5 papers), Fuzzy Logic and Control Systems (3 papers), Advanced Measurement and Metrology Techniques (3 papers), Iterative Learning Control Systems (3 papers), Optical measurement and interference techniques (2 papers), Advanced Machining and Optimization Techniques (2 papers), Industrial Vision Systems and Defect Detection (2 papers) and Industrial Technology and Control Systems (2 papers). The work is most often cited by research in Mechanical Engineering (251 citations), Industrial and Manufacturing Engineering (59 citations), Biomedical Engineering (134 citations), Electrical and Electronic Engineering (142 citations) and Control and Systems Engineering (53 citations). C.Y. Nian has collaborated with scholars based in Taiwan and Indonesia. Frequent co-authors include Y.S. Tarng, Weihong Yang, Chih-Chang Lin, J. Y. Kao, Chung-Wei Chen, Hsiu‐Ming Wu and Hendro Nurhadi. Their work appears in journals such as Journal of Materials Processing Technology, Electronics, International Journal of Machine Tools and Manufacture, Journal of Intelligent Manufacturing and International Journal of Systems Science.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.