C. Eiche
Impact in
- Radiation top 5%
- Radiation Detection and Scintillator Technologies
-
- Advanced Semiconductor Detectors and Materials
- Chalcogenide Semiconductor Thin Films
Papers in
-
- Advanced Semiconductor Detectors and Materials 20
- Chalcogenide Semiconductor Thin Films 13
- Integrated Circuits and Semiconductor Failure Analysis 3
-
- Quantum Dots Synthesis And Properties 5
- Electronic and Structural Properties of Oxides 2
- Co-authors
- K.W. Benz (14 shared papers)M. Fiederle (13 shared papers)M. Salk (7 shared papers)B. K. Meyer (4 shared papers)R. Schwarz (9 shared papers)D.M. Hofmann (3 shared papers)Wolfgang Stadler (3 shared papers)D. Ebling (9 shared papers)
- Journals
- Journal of Crystal Growth (12 papers)Journal of Applied Physics (4 papers)Journal of Physics Condensed Matter (1 paper)Optical Materials (1 paper)Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1 paper)
In The Last Decade
C. Eiche
22 papers receiving 494 citations
Peers
Comparison fields: 5 of 37
- Radiation 131
- Electrical and Electronic Engineering 492
- Atomic and Molecular Physics, and Optics 168
- Materials Chemistry 206
- Biomedical Engineering 74
Countries citing papers authored by C. Eiche
This map shows the geographic impact of C. Eiche's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by C. Eiche with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites C. Eiche more than expected).
Fields of papers citing papers by C. Eiche
This network shows the impact of papers produced by C. Eiche. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by C. Eiche. The network helps show where C. Eiche may publish in the future.
Co-authors
The 21 scholars most cited alongside C. Eiche, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 22 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 1998 | 180 | |
| 2 | 1994 | 83 | |
| 3 | 1992 | 31 | |
| 4 | 1993 | 28 | |
| 5 | 1995 | 26 | |
| 6 | 1996 | 24 | |
| 7 | 1993 | 21 | |
| 8 | 1997 | 20 | |
| 9 | 1995 | 15 | |
| 10 | 1993 | 14 | |
| 11 | 1995 | 13 | |
| 12 | 1995 | 12 | |
| 13 | 1995 | 11 | |
| 14 | 1996 | 10 | |
| 15 | 1993 | 10 | |
| 16 | 1996 | 10 | |
| 17 | 1995 | 9 | |
| 18 | 1994 | 3 | |
| 19 | 1996 | 3 | |
| 20 | 1994 | 2 |
About C. Eiche
C. Eiche is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Mechanics of Materials and Radiation, having authored 22 papers that have together received 528 indexed citations. Recurring topics across this work include Advanced Semiconductor Detectors and Materials (20 papers), Chalcogenide Semiconductor Thin Films (13 papers), Quantum Dots Synthesis And Properties (5 papers), Thermography and Photoacoustic Techniques (5 papers), Integrated Circuits and Semiconductor Failure Analysis (3 papers), Semiconductor Quantum Structures and Devices (3 papers), Electronic and Structural Properties of Oxides (2 papers) and Advanced X-ray and CT Imaging (2 papers). The work is most often cited by research in Radiation (131 citations), Electrical and Electronic Engineering (492 citations), Atomic and Molecular Physics, and Optics (168 citations), Materials Chemistry (206 citations) and Biomedical Engineering (74 citations). C. Eiche has collaborated with scholars based in Germany and Poland. Frequent co-authors include K.W. Benz, M. Fiederle, M. Salk, B. K. Meyer, R. Schwarz, D.M. Hofmann, Wolfgang Stadler, D. Ebling, K. W. Benz and Jürgen Weese. Their work appears in journals such as Journal of Crystal Growth, Journal of Applied Physics, Journal of Physics Condensed Matter, Optical Materials and Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.