B J Eves
Impact in
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- Force Microscopy Techniques and Applications
- Surface and Thin Film Phenomena
- Surfaces, Coatings and Films top 10%
Papers in
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- Force Microscopy Techniques and Applications 5
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- Advanced Measurement and Metrology Techniques 11
- Co-authors
- Gregory P. Lopinski (8 shared papers)Han Zuilhof (2 shared papers)J E Decker (4 shared papers)Krister Svensson (2 shared papers)Richard E. Palmer (2 shared papers)Frederic Festy (2 shared papers)Danial D. M. Wayner (1 shared paper)Robert L. Donkers (1 shared paper)
- Journals
- Metrologia (7 papers)Measurement Science and Technology (6 papers)Surface Science (2 papers)Langmuir (2 papers)Physical Review B (1 paper)
- Partner nations
- CanadaUnited StatesUnited Kingdom
In The Last Decade
B J Eves
25 papers receiving 499 citations
Peers
Comparison fields: 5 of 52
- Atomic and Molecular Physics, and Optics 207
- Surfaces, Coatings and Films 45
- Structural Biology 8
- Electrical and Electronic Engineering 287
- Statistics, Probability and Uncertainty 34
Countries citing papers authored by B J Eves
This map shows the geographic impact of B J Eves's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by B J Eves with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites B J Eves more than expected).
Fields of papers citing papers by B J Eves
This network shows the impact of papers produced by B J Eves. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by B J Eves. The network helps show where B J Eves may publish in the future.
Co-authors
The 25 scholars most cited alongside B J Eves, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.
All Works
Showing the 20 most-cited of 26 papers — load more, or switch the sort, to bring in the rest.
| # | Work | ||
|---|---|---|---|
| 1 | 2004 | 103 | |
| 2 | 2005 | 44 | |
| 3 | 2006 | 41 | |
| 4 | 2009 | 37 | |
| 5 | 2005 | 32 | |
| 6 | 2000 | 30 | |
| 7 | 2005 | 29 | |
| 8 | 2007 | 27 | |
| 9 | 2006 | 26 | |
| 10 | 2002 | 23 | |
| 11 | 1999 | 20 | |
| 12 | 2005 | 19 | |
| 13 | 2006 | 14 | |
| 14 | 2013 | 14 | |
| 15 | 2010 | 14 | |
| 16 | 2009 | 13 | |
| 17 | 2019 | 10 | |
| 18 | 2008 | 7 | |
| 19 | 2023 | 6 | |
| 20 | 2012 | 4 |
About B J Eves
B J Eves is a scholar working on Atomic and Molecular Physics, and Optics, Mechanical Engineering, Electrical and Electronic Engineering, Biomedical Engineering and Computer Vision and Pattern Recognition, having authored 26 papers that have together received 523 indexed citations. Recurring topics across this work include Advanced Measurement and Metrology Techniques (11 papers), Molecular Junctions and Nanostructures (8 papers), Semiconductor materials and devices (8 papers), Optical measurement and interference techniques (7 papers), Scientific Measurement and Uncertainty Evaluation (7 papers), Force Microscopy Techniques and Applications (5 papers), Surface Roughness and Optical Measurements (5 papers) and Nanowire Synthesis and Applications (4 papers). The work is most often cited by research in Atomic and Molecular Physics, and Optics (207 citations), Surfaces, Coatings and Films (45 citations), Structural Biology (8 citations), Electrical and Electronic Engineering (287 citations) and Statistics, Probability and Uncertainty (34 citations). B J Eves has collaborated with scholars based in Canada, United States and United Kingdom. Frequent co-authors include Gregory P. Lopinski, Han Zuilhof, J E Decker, Krister Svensson, Richard E. Palmer, Frederic Festy, Danial D. M. Wayner, Robert L. Donkers, T. Mischki and Federico Rosei. Their work appears in journals such as Metrologia, Measurement Science and Technology, Surface Science, Langmuir and Physical Review B.
Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.