A. Shih

2.0k citations
78 papers · 1.7k · h-index 23

Impact in

Papers in

A. Shih

77 papers receiving 1.6k citations

Peers

A. Shih
Comparison fields: 5 of 49
  • Surfaces, Coatings and Films 387
  • Condensed Matter Physics 232
  • Materials Chemistry 874
  • Atomic and Molecular Physics, and Optics 560
  • Electrical and Electronic Engineering 915
Replace G.A. Haas with:
G.A. Haas United States
W. N. Unertl United States
Yuden Teraoka Japan
D. Bolmont France
J. Ferrón Argentina
G. P. Schwartz United States
L. K�ubler France
Tadashi Narusawa Japan
E. Zoethout Netherlands
P. W. Chye United States
A. Shih relative to G.A. Haas United States G.A. Haas's profile →
Citations per field
00.5×2×3×4.2×
G.A. Haas · 1×
Citations per year

Countries citing papers authored by A. Shih

Since Specialization
Citations

This map shows the geographic impact of A. Shih's research. It shows the number of citations coming from papers published by authors working in each country. You can also color the map by specialization and compare the number of citations received by A. Shih with the expected number of citations based on a country's size and research output (numbers larger than one mean the country cites A. Shih more than expected).

Fields of papers citing papers by A. Shih

Since Specialization
Physical SciencesHealth SciencesLife SciencesSocial Sciences

This network shows the impact of papers produced by A. Shih. Nodes represent research fields, and links connect fields that are likely to share authors. Colored nodes show fields that tend to cite the papers produced by A. Shih. The network helps show where A. Shih may publish in the future.

Co-authors

The 25 scholars most cited alongside A. Shih, linked wherever they have co-authored with each other. Click a name or a connecting line to browse the papers they share.

Border = papers with A. Shih Line = papers co-authored together A. Shih links everyone, so they are left out of the graph.

All Works

20 of 20 papers shown

Showing the 20 most-cited of 78 papers — load more, or switch the sort, to bring in the rest.

#Work
1 1997150
2 1987126
3 199790
4 200076
5 197569
6 199365
7 198859
8 198355
9 198853
10 199753
11 197449
12 198340
13 200438
14 198336
15 197435
16 197933
17 198331
18 197731
19 197729
20 199428

About A. Shih

A. Shih is a scholar working on Electrical and Electronic Engineering, Materials Chemistry, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films and Condensed Matter Physics, having authored 78 papers that have together received 1.7k indexed citations. Recurring topics across this work include Semiconductor materials and devices (35 papers), Electronic and Structural Properties of Oxides (17 papers), Diamond and Carbon-based Materials Research (16 papers), Electron and X-Ray Spectroscopy Techniques (16 papers), Advanced Chemical Physics Studies (11 papers), Catalytic Processes in Materials Science (11 papers), Metal and Thin Film Mechanics (8 papers) and Plasma Diagnostics and Applications (7 papers). The work is most often cited by research in Surfaces, Coatings and Films (387 citations), Condensed Matter Physics (232 citations), Materials Chemistry (874 citations), Atomic and Molecular Physics, and Optics (560 citations) and Electrical and Electronic Engineering (915 citations). A. Shih has collaborated with scholars based in United States. Frequent co-authors include J. E. Yater, G.A. Haas, C. Hor, C. R. K. Marrian, R.H. Abrams, Roger Stockbauer, Richard L. Kurtz, R.E. Thomas, V. Adrian Parsegian and J. E. Butler. Their work appears in journals such as Applied Surface Science, IEEE Transactions on Electron Devices, Journal of Applied Physics, Physical review. B, Condensed matter and Surface Science.

Rankless uses publication and citation data sourced from OpenAlex, an open and comprehensive bibliographic database. While OpenAlex provides broad and valuable coverage of the global research landscape, it—like all bibliographic datasets—has inherent limitations. These include incomplete records, variations in author disambiguation, differences in journal indexing, and delays in data updates. As a result, some metrics and network relationships displayed in Rankless may not fully capture the entirety of a scholar's output or impact.

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